Amorphous arsenic chalcogenide films modified using rare-earth complexes

被引:11
作者
Kozyukhin, S. A.
Voronkov, E. N.
Kuz'mina, N. P.
机构
[1] RAS, NS Kurnakov Gen & Inorgan Chem Inst, Dept Magnet Mat, Moscow 119991, Russia
[2] Tech Univ, Moscow Power Engn Inst, Moscow 111250, Russia
[3] Moscow MV Lomonosov State Univ, Dept Chem, Moscow 119899, Russia
基金
俄罗斯基础研究基金会;
关键词
electrical and electronic properties; conductivity; films and coatings; chemical vapor deposition; infrared glasses; chalcogenides; optical properties; absorption; rare-earths in glasses;
D O I
10.1016/j.jnoncrysol.2006.02.011
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The optical absorption and current-voltage characteristic of amorphous arsenic chalcogenide As2X3 (X = S, Se) films modified by rare-earth complexes with organic mixed-ligands have been studied. The following two types of complexes were used: europium dipivaloylmethanate Eu(thd)(3) and lanthanide diethyldithiocarbamates Ln(ddtc)(3) (Ln = Pr, Eu). It was shown that the use of rare-earth mixed-complexes with similar volatility to the chalcogenide volatility permits the deposition of amorphous films by thermal evaporation. The decrease in absorption coefficient at the Urbach's edge after introduction of the europium dipivaloylmethanate complexes containing oxygen in arsenic selenide has been revealed. The type of organic ligands, incorporated in the amorphous matrix, determines the shape of current-voltage characteristic. The observed results have been discussed on the basis of the different rigidity of the structure of amorphous arsenic chalcogenides. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:1547 / 1550
页数:4
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