Interfacial reactions between lead-free solders and the multilayer Au/Ni/SUS304 substrate

被引:11
|
作者
Yen, Yee-Wen [1 ]
Lee, Chun-Yu [1 ]
Kuo, Meng-Han [1 ]
Chao, Kuo-Sing [1 ]
Chen, Kuen-Da [1 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Grad Inst Mat Sci & Technol, Taipei 10672, Taiwan
关键词
Sn-3.0 wt.% Ag-0.5 wt.% Cu (SAC); Stainless steel; Reaction couple; Intermetallic compound; Diffusion-controlled; NI; SN; SOLIDIFICATION; METALLIZATION; PACKAGES; KINETICS; SN/CU;
D O I
10.3139/146.110080
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
Interfacial reactions between Sn, Sn-3.0 wt.% Ag-0.5 wt.% Cu (SAC) and an Au/Ni/SUS304 stainless steel (SUS304) substrate were conducted using the reaction couple technique at 240, 255 and 270 degrees C for 1-5 h. In the earliest stage of the reaction, only the Ni3Sn4 phase was formed on the Sn/Au/Ni/SUS304 interface. As the reaction time increased to 4 h, the Ni layer was gradually consumed and the Ni3Sn4 phase detached from the interface. Meanwhile, the Sn reacted with the SUS304 to form the FeSn2 phase. In the SAC/Au/Ni/SUS304 reaction couple, both Ni3Sn4 and CU6Sn5 phases were formed on the interface. When the reaction time exceeded 4 h, the Ni3Sn4 phase disappeared; the CU6Sn5 phase was spread over the SUS304 surface and the FeSn2 phase was formed on the SUS304 surface. The growth of intermetallic compounds can be described by the parabolic law and the reactions were diffusion-controlled.
引用
收藏
页码:672 / 676
页数:5
相关论文
共 50 条
  • [41] Interface microstructures between Ni-P alloy plating and Sn-Ag-(Cu) lead-free solders
    Hwang, CW
    Suganuma, K
    Kiso, M
    Hashimoto, S
    JOURNAL OF MATERIALS RESEARCH, 2003, 18 (11) : 2540 - 2543
  • [42] Investigation of the interfacial reactions and growth behavior of interfacial intermetallic compound between Sn37Pb solder and Au/Ni/Kovar substrate
    Bao, Nifa
    Hu, Xiaowu
    Li, Qinglin
    MATERIALS RESEARCH EXPRESS, 2019, 6 (07)
  • [43] Solid-state and liquid-state interfacial reactions between Sn-based solders and single crystal Ag substrate
    Zou, H. F.
    Zhang, Z. F.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 469 (1-2) : 207 - 214
  • [44] Viscoplastic Creep Characterization of Novel Sn-0.7Cu-0.2Ni-xAl Lead-Free Solders for Electronic Applications
    Dawood, Mahmoud S.
    Eladly, S. A.
    El-Taher, A. M.
    ARAB JOURNAL OF NUCLEAR SCIENCES AND APPLICATIONS, 2021, 54 (01): : 85 - 96
  • [45] A Study on the Physical Properties and Interfacial Reactions with Cu Substrate of Rapidly Solidified Sn-3.5Ag Lead-Free Solder
    Hai-Tao Ma
    Jie Wang
    Lin Qu
    Ning Zhao
    A. Kunwar
    Journal of Electronic Materials, 2013, 42 : 2686 - 2695
  • [46] Interfacial Reaction between Zn-Al-Based High-Temperature Solders and Ni Substrate
    Yoshikazu Takaku
    Komei Makino
    Keita Watanabe
    Ikuo Ohnuma
    Ryosuke Kainuma
    Yasushi Yamada
    Yuji Yagi
    Ikuo Nakagawa
    Takashi Atsumi
    Kiyohito Ishida
    Journal of Electronic Materials, 2009, 38 : 54 - 60
  • [47] Interfacial Reaction between Zn-Al-Based High-Temperature Solders and Ni Substrate
    Takaku, Yoshikazu
    Makino, Komei
    Watanabe, Keita
    Ohnuma, Ikuo
    Kainuma, Ryosuke
    Yamada, Yasushi
    Yagi, Yuji
    Nakagawa, Ikuo
    Atsumi, Takashi
    Ishida, Kiyohito
    JOURNAL OF ELECTRONIC MATERIALS, 2009, 38 (01) : 54 - 60
  • [48] Study of the Effects of Zn Content on the Interfacial Reactions Between Sn-Zn Solders and Ni Substrates at 250°C
    Wang, Chao-Hong
    Chen, Hsien-Hsin
    JOURNAL OF ELECTRONIC MATERIALS, 2010, 39 (11) : 2375 - 2381
  • [49] Physical properties of Sn58Bi-xNi lead-free solder and its interfacial reaction with copper substrate
    Kanlayasiri, Kannachai
    Ariga, Tadashi
    MATERIALS & DESIGN, 2015, 86 : 371 - 378
  • [50] Strong inhibition of boron dopant on IMC growth between electroplating Co(B) deposits and lead-free solders at 250 °C
    Wang, Chao-hong
    Guo, Yu-bin
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2023, 34 (15)