A spectrum-based inversion method for the evaluation of nanoscale wrinkling amplitude

It is known that the measurement of nanoscale wrinkling amplitude is a challenge for existing technology due to its high sensitivity to the environment. In this paper, a spectrum-based inversion method is proposed to evaluate the nanoscale amplitude. The wrinkling characteristics, including wrinkling amplitude and wavelength, can simply be obtained from a two-dimensional wrinkling image. The predictions agree well with the results from previous published works, indicating its robustness to capture the wrinkling characteristics with no wrinkling pattern effect. In addition, the method can be easily grasped by the researchers and independent on the equipment. The result in this paper makes sense for measurement, mechanism and engineering application of nanoscale wrinkles.