Dopant accumulation during substitutional-interstitial diffusion in semiconductors

被引:16
作者
Lyubomirsky, I [1 ]
Lyahovitskaya, V [1 ]
Cahen, D [1 ]
机构
[1] WEIZMANN INST SCI,DEPT MAT & INTERFACES,IL-76100 REHOVOT,ISRAEL
关键词
D O I
10.1063/1.118290
中图分类号
O59 [应用物理学];
学科分类号
摘要
When p-n junctions are formed by doping with a dopant that diffuses via a dissociative diffusion mechanism, dopant diffusion is suppressed and dopants can pile up near the junction, well above their original concentration. Calculations confirm this, if no local neutrality is assumed. The results agree well with published and our own experimental data for Zn diffusion in InP. The increased built-in electric field due to this pileup is expelled nearly completely to the side of the junction without the pileup. This effect has important consequences for devices containing thin and/or small regions doped with such dopants because such regions may be completely depleted. (C) 1997 American Institute of Physics.
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页码:613 / 615
页数:3
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