Thermal Pathfinding for 3-D ICs

被引:8
作者
Priyadarshi, Shivam [1 ]
Davis, W. Rhett [1 ]
Steer, Michael B. [1 ]
Franzon, Paul D. [1 ]
机构
[1] N Carolina State Univ, Raleigh, NC 27695 USA
来源
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 2014年 / 4卷 / 07期
关键词
3-D IC; electronic system-level (ESL); electrothermal simulation; pathfinding; through-silicon via (TSV); transaction-level simulation; PERFORMANCE; DESIGN; SIMULATION; POWER;
D O I
10.1109/TCPMT.2014.2321005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
System architects traditionally use high-level models of component blocks to predict trends for various design metrics. However, with continually increasing design complexity and a confusing array of manufacturing choices, system-level design decisions cannot be made without considering physical-level details. This effect is more pronounced for 3-D integrated circuits (ICs) because it provides a plethora of physical-level design choices, such as the number of stacking layers and the type of 3-D bonding method, along with the choices provided by 2-D ICs. Thus, it is necessary for system-level flows to predict the complex interactions among system performance, power, temperature, floorplanning, process technology, computer architecture, and software/workloads. This is often called pathfinding. This paper presents a pathfinding flow that integrates SystemC transaction-level electrical and dynamic thermal simulations. The goal of this flow is to pass complex physical constraints to system architects in a convenient form. The applicability of the proposed flow is shown using an example stacking of two processor cores and L2 cache in two-tier 3-D stack.
引用
收藏
页码:1159 / 1168
页数:10
相关论文
共 22 条
[1]  
[Anonymous], P IEEE IEDM DEC
[2]  
[Anonymous], THESIS N CAROLINA ST
[3]  
[Anonymous], P INT C COMP AID DES
[4]  
[Anonymous], P 3 WORKSH TACS JUN
[5]  
[Anonymous], FREEDA OPEN SOURCE M
[6]  
[Anonymous], THESIS N CAROLINA ST
[7]  
Bailey B., 2007, ESL Design and Verification: A Prescription for Electronic System Level Methodology
[8]   3-D ICs: A novel chip design for improving deep-submicrometer interconnect performance and systems-on-chip integration [J].
Banerjee, K ;
Souri, SJ ;
Kapur, P ;
Saraswat, KC .
PROCEEDINGS OF THE IEEE, 2001, 89 (05) :602-633
[9]   Multi-accuracy power and performance transaction-level modeling [J].
Beltrame, Giovanni ;
Sciuto, Donatella ;
Silvano, Cristina .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2007, 26 (10) :1830-1842
[10]   Interconnects in the third dimension: Design challenges for 3D ICs [J].
Bernstein, Kerry ;
Andry, Paul ;
Cann, Jerome ;
Emma, Phil ;
Greenberg, David ;
Haensch, Wilfried ;
Ignatowski, Mike ;
Koester, Steve ;
Magerlein, John ;
Puri, Ruchir ;
Young, Albert .
2007 44TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2, 2007, :562-+