Substrate-Dependent Molecular and Nanostructural Orientation of Nafion Thin Films

被引:40
作者
Kushner, Douglas, I [1 ]
Kusoglu, Ahmet [2 ]
Podraza, Nikolas J. [3 ]
Hickner, Michael A. [1 ]
机构
[1] Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA
[2] Lawrence Berkeley Natl Lab, Energy Storage & Distributed Resources Div, Berkeley, CA 94720 USA
[3] Univ Toledo, Dept Phys & Astron, Toledo, OH 43606 USA
关键词
confinement; functional coating; Nafion; orientation; thin films; GLASS-TRANSITION TEMPERATURE; MECHANICAL-PROPERTIES; OPTICAL-PROPERTIES; LIQUID-CRYSTAL; TRANSPORT; CONFINEMENT; MEMBRANE; SURFACE; ANGLE; POLYPROPYLENE;
D O I
10.1002/adfm.201902699
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The effects of film thickness and substrate composition on the ionomer structure in porous electrodes are critical in understanding pathways toward developing higher performance electrochemical devices, including fuel cells and batteries. Insights are gained into the molecular and nanostructural orientation dependence for thin Nafion films (12-300 nm thick) on gold, platinum, and SiO2 model substrates. Molecular orientation is determined from the birefringence measured using spectroscopic ellipsometry, while the nanostructural orientation of the ionic domains is measured using grazing-incidence small-angle X-ray scattering. Density functional theory calculations for the molecular polarizability of the Nafion backbone and side chain show complimentary contributions to the measured birefringence values for the material. Nafion films prepared on SiO2 substrates exhibit a nearly isotropic molecular and nanostructural orientation. Films on gold and platinum display parallel backbone orientations, relative to the substrate, with decreasing film thickness. However, a birefringence transition toward molecular isotropy is observed for 30 nm thick films on Au and Pt; while the ionic nanostructured domains continuously align parallel to the substrate. This apparent isotropic molecular orientation with increasing domain orientation highlights the difference between the backbone and side chain orientation, a key finding for elucidating transport in confined films at the interfaces.
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页数:10
相关论文
共 66 条
[1]   Morphology of Hydrated As-Cast Nafion Revealed through Cryo Electron Tomography [J].
Allen, Frances I. ;
Comolli, Luis R. ;
Kusoglu, Ahmet ;
Modestino, Miguel A. ;
Minor, Andrew M. ;
Weber, Adam Z. .
ACS MACRO LETTERS, 2015, 4 (01) :1-5
[2]  
[Anonymous], 1966, Optics and Spectroscopy
[3]   Anisotropy and densification of polymer ultrathin films as seen by multi-angle ellipsometry and X-ray reflectometry [J].
Ata, Seisuke ;
Kuboyama, Keiichi ;
Ito, Kenji ;
Kobayashi, Yoshinori ;
Ougizawa, Toshiaki .
POLYMER, 2012, 53 (04) :1028-1033
[4]   Surface-Induced Micelle Orientation in Nafion Films [J].
Bass, Maria ;
Berman, Amir ;
Singh, Amarjeet ;
Konovalov, Oleg ;
Freger, Viatcheslav .
MACROMOLECULES, 2011, 44 (08) :2893-2899
[5]   Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principle [J].
Chen, C ;
An, I ;
Ferreira, GM ;
Podraza, NJ ;
Zapien, JA ;
Collins, RW .
THIN SOLID FILMS, 2004, 455 :14-23
[6]   Oxygen permeability of cast ionomer films from chronoamperometry on microelectrodes [J].
Chlistunoff, Jerzy .
JOURNAL OF POWER SOURCES, 2014, 245 :203-207
[7]   Optical function spectra and bandgap energy of Cu2SnSe3 [J].
Choi, S. G. ;
Kang, J. ;
Li, J. ;
Haneef, H. ;
Podraza, N. J. ;
Beall, C. ;
Wei, S. -H. ;
Christensen, S. T. ;
Repins, I. L. .
APPLIED PHYSICS LETTERS, 2015, 106 (04)
[8]   THERMAL-CONDUCTIVITY OF POLYMERS [J].
CHOY, CL .
POLYMER, 1977, 18 (10) :984-1004
[9]   Phase segregation of sulfonate groups in Nafion interface lamellae, quantified via neutron reflectometry fitting techniques for multi-layered structures [J].
DeCaluwe, Steven C. ;
Kienzle, Paul A. ;
Bhargava, Pavan ;
Baker, Andrew M. ;
Dura, Joseph A. .
SOFT MATTER, 2014, 10 (31) :5763-5776
[10]   AN ALL-ELECTRON NUMERICAL-METHOD FOR SOLVING THE LOCAL DENSITY FUNCTIONAL FOR POLYATOMIC-MOLECULES [J].
DELLEY, B .
JOURNAL OF CHEMICAL PHYSICS, 1990, 92 (01) :508-517