BIST-PUF: Online, Hardware-based Evaluation of Physically Unclonable Circuit Identifiers

被引:0
作者
Hussain, Siam U. [1 ]
Yellapantula, Sudha [1 ]
Majzoobi, Mehrdad [2 ]
Koushanfar, Farinaz [1 ]
机构
[1] Rice Univ, ECE Dept, Houston, TX 77251 USA
[2] Mesh Mot Inc, Berkeley, CA USA
来源
2014 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD) | 2014年
基金
美国国家科学基金会;
关键词
Built In Self Test; Physical Unclonable Functions; PUF; BIST; Hardware security; DARPA SHIELD;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Physical Unclonable Functions (PUF) are of increasing importance due to their many hardware security applications including chip fingerprinting, metering, authentication, anti-counterfeiting, and supply-chain tracing, e.g., DARPA SHIELD. This paper presents BIST-PUF, the first built-in-self-test (BIST) methodology for online evaluation of weak and strong PUFs. BIST-PUF provides a paradigm shift in the evaluation of the un-clonable circuit identifiers: unlike earlier known PUF evaluation suites that are software-based and offline, BIST-PUF enables on-the-fly assessment of the desired PUF properties all in hardware. More specifically, the BIST-PUF structure is designed to evaluate two main properties of PUFs, namely unpredictability and stability. These properties are important for ensuring robustness and security in face of operational, structural, and environmental fluctuations due to variations, aging or adversarial acts. For BIST-PUF unpredictability evaluation, we identify and adopt the tests of randomness that are amenable to hardware implementation. For stability assessment, the BIST-PUF suggests three distinct methods, namely, sensor-based, parametric interrogation, and multiple interrogations. Proof-of-concept implementation of the BIST-PUF in FPGA demonstrates its low overhead, effectiveness, and practicality.
引用
收藏
页码:162 / 169
页数:8
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