Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

被引:19
作者
Melikyan, Harutyun [1 ,2 ]
Sargsyan, Tigran [1 ,2 ]
Babajanyan, Arsen [1 ,2 ]
Kim, Seungwan [1 ,2 ]
Kim, Jongchel [1 ,2 ]
Lee, Kiejin [1 ,2 ]
Friedman, Barry [3 ]
机构
[1] Sogang Univ, Dept Phys, Seoul 121742, South Korea
[2] Sogang Univ, Interdisciplinary Program Integrated Biotechnol, Seoul 121742, South Korea
[3] Sam Houston State Univ, Dept Phys, Huntsville, TX 77341 USA
关键词
Hard disk; Magnetic domain; Permeability; Near-field; AFM tip; Microwave; THIN-FILMS; RECORDING MEDIA;
D O I
10.1016/j.jmmm.2009.03.068
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A near-field scanning microwave microscope (NSMM) incorporating an atomic force microscope (AFM) probe tip was used for the direct imaging of magnetic domains of a hard disk under an external magnetic field. We directly imaged the magnetic domain changes by measuring the change of reflection coefficient S-11 of the NSMM at an operating frequency near 4.4 GHz. Comparison was made to the magnetic force microscope (MFM) image. Using the AFM probe tip coupled to the tuning fork distance control system enabled nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitative measurement of magnetic domains with nano-scale resolution and high sensitivity. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:2483 / 2487
页数:5
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