Gamma-Ray Response of Semi-Insulating CdMnTe Crystals

被引:46
作者
Kim, KiHyun [1 ]
Cho, ShinHang [2 ]
Suh, JongHee [2 ]
Hong, Jinki [2 ]
Kim, SunUng [2 ]
机构
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
[2] Korea Univ, Dept Phys, Chungnam 339800, South Korea
关键词
CdMnTe; CdZnTe; compensation; segregation coefficient; sulfur passivation; X-ray detector; X-RAY; BRIDGMAN METHOD; DETECTORS; GROWTH; CDZNTE; CD1-XMNXTE;
D O I
10.1109/TNS.2009.2015662
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Semi-insulating Cd0.9Mn0.1Te : In crystals are grown by vertical Bridgman method. The segregation coefficient of Mn in CdTe is nearly 1 so that all the CdMnTe samples obtained from one ingot have nearly a same Mn composition. Also sulfur-based passivation effectively prevent the formation of Te-oxide but large amount of Mn exist as a MnO on the CdMnTe surface. The resistivity of CdMnTe samples are low 10(10) Omega cm and well resolved Am-241 gamma peaks are seen for all detectors. The difference in spectral response can be attributed to the effect of excess Te and conductivity change due to over-compensation induced by indium segregation in CdMnTe. The mobility-lifetime products evaluated from the dependence of peak location on the bias voltage are 1 x 10(-3) cm(2)/V. The higher mobility-lifetime products in our CdMnTe crystals than other previous reports are assumed due to minimization of impurity contents in MnTe by several zone refining process.
引用
收藏
页码:858 / 862
页数:5
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