Charge transport measurement using the Metal-Insulator-Semiconductor Charge Extraction by Linearly Increasing Voltage (MIS-CELIV) technique is a promising method for determining charge mobility in organic semiconductors because of its ability to study electron and hole mobilities independently. However, MIS-CELIV measurements have a number of parameters that can potentially affect the calculated mobility. There are only a few reports on MIS-CELIV being used to determine the charge mobility for materials typically used in organic light-emitting diodes (OLEDs), and the impact of each of the MIS-CELIV experimental parameters on the mobility is presently unknown. We find that the pulse duration, injection time, maximum voltage, offset voltage, and external load resistance have different levels of influence on the calculated mobility. Using the hole transporting OLED host material, tris(4-carbazoyl-9-ylphenyl)amine (TCTA), we show that having an injection time sufficient to fully charge the insulator layer, a pulse duration comparable to the transit time, and an external circuit time constant much smaller than the transit time is required to give a mobility relevant to an OLED. The optimized MIS-CELIV parameters led to the measurement having a similar current density and electric field to that of an operational OLED. Under these conditions, the hole mobility of TCTA was determined to be 2.90 +/- 0.07x10(-4)cm(2)V(-1)s(-1), which is similar to that measured using time-of-flight techniques. Using inappropriate experimental parameters could lead to an underestimation of the mobility by an order of magnitude. Simulations of the MIS-CELIV measurements verified the effect the different parameters played in determining the charge mobility.
