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Optimized entropic uncertainty for successive projective measurements
被引:28
作者:
Baek, Kyunghyun
[1
]
Farrow, Tristan
[2
,3
]
Son, Wonmin
[1
]
机构:
[1] Sogang Univ, Dept Phys, Seoul 121742, South Korea
[2] Univ Oxford, Clarendon Lab, Oxford OX1 3PU, England
[3] Natl Univ Singapore, Ctr Quantum Technol, Singapore 117543, Singapore
来源:
PHYSICAL REVIEW A
|
2014年
/
89卷
/
03期
基金:
新加坡国家研究基金会;
关键词:
QUANTUM MEASUREMENTS;
DISTURBANCE;
PRINCIPLE;
OBSERVABLES;
D O I:
10.1103/PhysRevA.89.032108
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
We focus here on the uncertainty of an observable Y caused by a precise measurement of X. We illustrate the effect by analyzing the general scenario of two successive measurements of spin components X and Y. We derive an optimized entropic uncertainty limit that quantifies the necessary amount of uncertainty observed in a subsequent measurement of Y. We compare this bound to recently derived error-disturbance relations and discuss how the bound quantifies the information of successive quantum measurements.
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页数:6
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