Measuring SER by Neutron Irradiation Between Volatile SRAM-based and Nonvolatile Flash-based FPGAs

被引：0
作者：
Kawano, Yuya [1 ]
Tsukita, Yuto [1 ]
Furuta, Jun [1 ]
Kobayashi, Kazutoshi [1 ]
机构：
[1] Kyoto Inst Technol, Kyoto, Japan
来源：
2019 19TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) | 2022年
关键词：
D O I：
10.1109/RADECS47380.2019.9745707
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We implemented 50k-bit shift registers on SRAMbased and flash-based FPGAs to investigate their radiation hardness. As a result, soft error rates of flip flops on both FPGAs are around 40 FIT/Mbit. Mean time to failure (MTTF) in the SRAM-based one is 3.8 x 10(7) hour/failure, while MTTF in flash-based one is 5.5 x 10(9) hour/failure. Those results clearly show that in the SRAM-based FPGA must be rebooted or configuration memory must be refreshed much more frequently than the flash-based one.
引用
收藏
页码：379 / 382
页数：4
相关论文
共 11 条
[1]  
[Anonymous], 2012, XAPP538 XIL
[2]  
[Anonymous], 2018, TEST REPORT POLARFIR
[3]  
[Anonymous], 2019, USER GUIDE UG116 V10
[4]   Low Overhead Soft Error Mitigation Techniques for High-Performance and Aggressive Designs [J].
Avirneni, Naga Durga Prasad ;
Somani, Arun K. .
IEEE TRANSACTIONS ON COMPUTERS, 2012, 61 (04) :488-501
[5]  
Dsilva D, 2015, IEEE RADIAT EFFECTS, P5, DOI [10.1109/REDW.2015.7336739, 10.1109/REDW.2015.7336722]
[6]   Soft Errors Induced by High-Energy Electrons [J].
Gadlage, Matthew J. ;
Roach, Austin H. ;
Duncan, Adam R. ;
Williams, Aaron M. ;
Bossev, Dobrin P. ;
Kay, Matthew J. .
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2017, 17 (01) :157-162
[7]   Electron-Induced Single-Event Upsets in 45-nm and 28-nm Bulk CMOS SRAM-Based FPGAs Operating at Nominal Voltage [J].
Gadlage, Matthew J. ;
Roach, Austin H. ;
Duncan, Adam R. ;
Savage, Mark W. ;
Kay, Matthew J. .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 62 (06) :2717-2724
[8]  
Maillard P, 2015, IEEE RADIAT EFFECTS, P15
[9]  
Maruoka H., 2016, 2016 16 EUR C RAD IT, P1
[10]   A Generic Methodology to Compute Design Sensitivity to SEU in SRAM-based FPGA [J].
Mousavi, Mahsa ;
Pourshaghaghi, Hamid Reza ;
Tahghighi, Mohammad ;
Jordans, Roel ;
Corporaal, Henk .
2018 21ST EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN (DSD 2018), 2018, :221-228
12