Dielectric Resonators for the Measurements of the Surface Impedance of Superconducting Films

被引：36

作者：

Pompeo, N. ^{[1
]}

Torokhtii, K. ^{[1
]}

Silva, E. ^{[1
]}

机构：

[1] Univ Roma Tre, Dipartimento Ingn, I-00146 Rome, Italy

来源：

MEASUREMENT SCIENCE REVIEW | 2014年 / 14卷 / 03期

关键词：

Microwave methods; dielectric resonators; superconductors; surface impedance; thin films; low temperature; CAVITY PERTURBATION TECHNIQUE; THIN-FILMS; HTS FILMS; RESISTANCE MEASUREMENTS; MICROWAVE TRANSMISSION; ACCURATE MEASUREMENTS; TEMPERATURE; MODE;

D O I：

10.2478/msr-2014-0022

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present the development, realization and setup of dielectric resonators, for the purpose of measuring the surface impedance at microwave frequencies of superconducting thin films. We focus on resonators designed to operate in dc magnetic fields, optimized for the measurements of the variation of the surface impedance with the applied field. Two resonators, operating at 8 and 48 GHz, are presented. We discuss different approaches to the measurement of the resonator parameters, with particular attention to the nonidealities of real setups in a cryogenic environment. Finally, we present some sample measurement of high-T-c and low-T-c superconducting films.

引用

页码：164 / 170

页数：7

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