Tensor of the second-order nonlinear susceptibility in asymmetrically strained silicon waveguides: analysis and experimental validation

被引:40
作者
Puckett, Matthew W. [1 ]
Smalley, Joseph S. T. [1 ]
Abashin, Maxim [1 ]
Grieco, Andrew [1 ]
Fainman, Yeshaiahu [1 ]
机构
[1] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92023 USA
基金
美国国家科学基金会;
关键词
ELECTROOPTIC MODULATOR; GENERATION; ENERGY;
D O I
10.1364/OL.39.001693
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We theoretically consider the existence of multiple nonzero components of the second-order nonlinear susceptibility tensor, chi((2)), generated via strain-induced symmetry breaking in crystalline silicon. We determine that, in addition to the previously reported chi((2))(xxy) component, the chi((2))(yyy) component also becomes nonzero based on the remaining symmetry present in the strained material. In order to characterize these two nonlinearities, we fabricate Fabry-Perot waveguide resonators on 250 nm thick silicon-on-insulator wafers clad with 180 nm of compressively stressed (-1.275 GPa) silicon nitride. We measure the shifts in these devices' modal effective indices in response to several bias electric fields and calculate the chi((2))(eff,xxx) and chi((2))(eff,yyy) nonlinear susceptibility tensor elements induced by the breaking of the guiding material's inversion symmetry. Through the incorporation of finite element simulations encompassing the theoretical distribution of strain, the applied bias field, and the optical modes supported by the waveguide geometry, we extract two phenomenological scaling coefficients which relate the induced optical nonlinearities to the local strain gradient. (C) 2014 Optical Society of America
引用
收藏
页码:1693 / 1696
页数:4
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