Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH

被引：66

作者：

Steffen, B. ^{[2
,3
]}

Arsov, V. ^{[2
]}

Berden, G. ^{[1
]}

Gillespie, W. A. ^{[4
]}

Jamison, S. P. ^{[5
]}

MacLeod, A. M. ^{[6
]}

van der Meer, A. F. G. ^{[1
]}

Phillips, P. J. ^{[4
]}

Schlarb, H. ^{[2
]}

Schmidt, B. ^{[2
]}

Schmueser, P. ^{[2
]}

机构：

[1] FOM Inst Plasma Phys Rijnhuizen, Nieuwegein, Netherlands

[2] Deutsch Elektronen Synchrotron DESY, Hamburg, Germany

[3] Paul Scherrer Inst, Villigen, Switzerland

[4] Univ Dundee, Dundee, Scotland

[5] Accelerator Sci & Technol Ctr, STFC Daresbury Lab, Warrington, Cheshire, England

[6] Univ Abertay Dundee, Sch Comp & Adv Technol, Dundee, Scotland

来源：

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS | 2009年 / 12卷 / 03期

基金：

英国工程与自然科学研究理事会;

关键词：

TERAHERTZ PULSES;

D O I：

10.1103/PhysRevSTAB.12.032802

中图分类号：

O57 [原子核物理学、高能物理学];

学科分类号：

070202 ;

摘要：

Precise measurements of the temporal profile of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time profile of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deflecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.

引用

页数：16

共 21 条

[21] Subpicosecond electro-optic measurement of relativistic electron pulses [J].

Yan, X ;

MacLeod, AM ;

Gillespie, WA ;

Knippels, GMH ;

Oepts, D ;

van der Meer, AFG ;

Seidel, W .

PHYSICAL REVIEW LETTERS, 2000, 85 (16) :3404-3407

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