Pressure study of monoclinic ReO2 up to 1.2 GPa using X-ray absorption spectroscopy and X-ray diffraction

被引:8
|
作者
Ferreira, Fabio Furlan [1 ]
Correa, Hamilton P. S. [2 ]
Orlando, Marcos T. D. [3 ]
Passamai, Jose L., Jr. [3 ]
Orlando, Cintia G. P. [3 ]
Cavalcante, Isabela P. [2 ]
Garcia, Flavio [1 ]
Tamura, Edilson [1 ]
Martinez, Luis G. [4 ]
Rossi, Jesualdo L. [4 ]
de Melo, Francisco C. L. [5 ]
机构
[1] Lab Nacl Luz Sincrotron, BR-13083970 Campinas, SP, Brazil
[2] Univ Fed Mato Grosso do Sul, CCET, BR-79070900 Campo Grande, MS, Brazil
[3] Univ Fed Espirito Santo, Dept Fis & Quim, CCE, BR-29075910 Vitoria, ES, Brazil
[4] IPEN CNEN SP, BR-05508000 Sao Paulo, Brazil
[5] Ctr Tecn Aeroespacial IEA, BR-12228904 Sao Jose Dos Campos, SP, Brazil
来源
JOURNAL OF SYNCHROTRON RADIATION | 2009年 / 16卷
关键词
X-ray diffraction; pressure; EXAFS; ReO2; POWDER DIFFRACTION; HG1-XREXBA2CA2CU3O8+DELTA SUPERCONDUCTOR; BEAMLINE; LNLS; REFINEMENT; STABILITY; HGCAO2; PHASE; XAFS;
D O I
10.1107/S0909049508036029
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The crystal and local atomic structure of monoclinic ReO2 (alpha-ReO2) under hydrostatic pressure up to 1.2 GPa was investigated for the first time using both X-ray absorption spectroscopy and high-resolution synchrotron X-ray powder diffraction and a home-built B4C anvil pressure cell developed for this purpose. Extended X-ray absorption fine-structure (EXAFS) data analysis at pressures from ambient up to 1.2 GPa indicates that there are two distinct Re-Re distances and a distorted ReO6 octahedron in the alpha-ReO2 structure. X-ray diffraction analysis at ambient pressure revealed an unambiguous solution for the crystal structure of the alpha-phase, demonstrating a modulation of the Re-Re distances. The relatively small portion of the diffraction pattern accessed in the pressure-dependent measurements does not allow for a detailed study of the crystal structure of alpha-ReO2 under pressure. Nonetheless, a shift and reduction in the (011) Bragg peak intensity between 0.4 and 1.2 GPa is observed, with correlation to a decrease in Re-Re distance modulation, as confirmed by EXAFS analysis in the same pressure range. This behavior reveals that alpha-ReO2 is a possible inner pressure gauge for future experiments up to 1.2 GPa.
引用
收藏
页码:48 / 56
页数:9
相关论文
共 50 条
  • [31] X-RAY ABSORPTION SPECTROSCOPY
    GARNER, CD
    NATURE, 1979, 277 (5692) : 89 - 90
  • [32] X-ray absorption spectroscopy
    不详
    NATURE REVIEWS METHODS PRIMERS, 2024, 4 (01):
  • [33] X-ray absorption spectroscopy
    Jacoby, M
    CHEMICAL & ENGINEERING NEWS, 2001, 79 (32) : 33 - 38
  • [34] X-ray absorption spectroscopy
    Junko Yano
    Vittal K. Yachandra
    Photosynthesis Research, 2009, 102 : 241 - 254
  • [35] High pressure X-ray diffraction experiments on NpS and PuS up to 60 GPa
    LE Bihan, T
    Heathman, S
    Rebizant, J
    HIGH PRESSURE RESEARCH, 1997, 15 (06) : 387 - 392
  • [36] Characterization of arsenate-for-sulfate substitution in synthetic jarosite using X-ray diffraction and X-ray absorption spectroscopy
    Paktunc, D
    Dutrizac, JE
    CANADIAN MINERALOGIST, 2003, 41 : 905 - 919
  • [37] Study on the High-Pressure Behavior of Goethite up to 32 GPa Using X-Ray Diffraction, Raman, and Electrical Impedance Spectroscopy
    Tang, Ruilian
    Chen, Jiuhua
    Zeng, Qiaoshi
    Li, Yan
    Liang, Xue
    Yang, Bin
    Wang, Yu
    MINERALS, 2020, 10 (02)
  • [38] The structure of bone studied with synchrotron X-ray diffraction, X-ray absorption spectroscopy and thermal analysis
    Peters, F
    Schwarz, K
    Epple, M
    THERMOCHIMICA ACTA, 2000, 361 (1-2) : 131 - 138
  • [39] X-ray spectroscopy and X-ray diffraction at wavelengths near the K-absorption edge of phosphorus
    Biou, V
    Bösecke, P
    Bois, JM
    Brandolin, G
    Kahn, R
    Mas, C
    Nauton, L
    Nury, H
    Pebay-Peyroula, E
    Vicat, J
    Stuhrmann, H
    JOURNAL OF SYNCHROTRON RADIATION, 2005, 12 : 402 - 409
  • [40] Probing the onset of crystallization of a microporous catalyst by combined X-ray absorption spectroscopy and X-ray diffraction
    Sankar, G
    Thomas, JM
    Rey, F
    Greaves, GN
    JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS, 1995, (24) : 2549 - 2550