A comparative study of microstructure of RuO2 nanorods via Raman scattering and field emission scanning electron microscopy

被引：28
作者：
Chen, RS
Chen, CC
Huang, YS
Chia, CT
Chen, HP
Tsai, DS
Tiong, KK
机构：
[1] Natl Taiwan Univ, Dept Elect Engn, Taipei 106, Taiwan
[2] Natl Taiwan Normal Univ, Dept Phys, Taipei 117, Taiwan
[3] Natl Taiwan Univ, Dept Chem Engn, Taipei 106, Taiwan
[4] Natl Taiwan Ocean Univ, Dept Elect Engn, Chilung 202, Taiwan
来源：
SOLID STATE COMMUNICATIONS | 2004年 / 131卷 / 06期
关键词：
nanostructures; field emission scanning electron microscopy; Raman scattering;
D O I：
10.1016/j.ssc.2004.06.002
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Raman scattering (RS) and field emission scanning electron microscopy (FESEM) have been used to extract microstructural information of RuO2 nanorods (NRs) and a two-phase system comprising NRs embedded in polycrystalline matrix deposited on different substrates by the metal-organic chemical vapor deposition method. The red shifts and asymmetric broadening of the Raman line shape for the NRs are analyzed by the spatial correlation model. The deduced spatial correlation length 1 is found to be much smaller than that of the average size L-0 estimated from the FESEM images. The Raman features for the two-phase system can be resolved into two parts: a Lorentzian line shape feature corresponding to the polycrystallite at higher frequency side and an asymmetrically broadened NRs' signature located at lower frequency end. The volume fraction of NRs in the two-phase system can be determined from the analysis. These results demonstrate the significance of RS as a structural characterization method when used in conjunction with FESEM. (C) 2004 Elsevier Ltd. All rights reserved.
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收藏
页码：349 / 353
页数：5
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