Optical characterization of stereolithography alumina suspensions using the Kubelka-Munk model

被引：67

作者：

Abouliatim, Y. ^{[1
,2
]}

Chartier, T. ^{[1
]}

Abelard, P. ^{[1
]}

Chaput, C. ^{[2
]}

Delage, C. ^{[2
]}

机构：

[1] CNRS, UMR 6638, ENSCI, SPCTS, F-87065 Limoges, France

[2] CTTC, F-87068 Limoges, France

来源：

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | 2009年 / 29卷 / 05期

关键词：

Stereolithography; Scattering; Alumina; Kubelka-Munk; DIFFUSE-REFLECTANCE; CERAMIC SUSPENSIONS; COLOR; RESIN;

D O I：

10.1016/j.jeurceramsoc.2008.07.008

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The multiple light scattering in concentrated alumina suspensions adapted to stereolithography can be modeled using diffuse reflectance measurements coupled to the Kubelka-Munk model. The penetration depth of UV radiation can be related to the scattering coefficient allowing the prediction of the cure depth with an accuracy of 20%. (c) 2008 Elsevier Ltd. All rights reserved.

引用

页码：919 / 924

页数：6

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