Optical characterization of stereolithography alumina suspensions using the Kubelka-Munk model

被引:65
作者
Abouliatim, Y. [1 ,2 ]
Chartier, T. [1 ]
Abelard, P. [1 ]
Chaput, C. [2 ]
Delage, C. [2 ]
机构
[1] CNRS, UMR 6638, ENSCI, SPCTS, F-87065 Limoges, France
[2] CTTC, F-87068 Limoges, France
关键词
Stereolithography; Scattering; Alumina; Kubelka-Munk; DIFFUSE-REFLECTANCE; CERAMIC SUSPENSIONS; COLOR; RESIN;
D O I
10.1016/j.jeurceramsoc.2008.07.008
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The multiple light scattering in concentrated alumina suspensions adapted to stereolithography can be modeled using diffuse reflectance measurements coupled to the Kubelka-Munk model. The penetration depth of UV radiation can be related to the scattering coefficient allowing the prediction of the cure depth with an accuracy of 20%. (c) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码:919 / 924
页数:6
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