Macromodel of electro-thermal feedback for nonlinear microbolometers

被引:0
|
作者
Ou-Yang, Mang [1 ]
Huang, Shi-Wen [1 ]
Tsai, Shu-Fei [2 ]
Ko, Hsin-Yik [2 ]
Wen, Bor-Jiunn [2 ]
机构
[1] Natl Cent Univ, Inst Opt Sci, 300 Chung Da Rd, Chungli 32001, Taiwan
[2] Ctr Measurement Standards Ind Technol Res Inst, Hsinchu 300, Taiwan
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Recent simulation challenges for microsensors in parallel with the development of new technology, new device configuration and applications are attempting to break the static and several simulation means, by using lumped low-order models of device behavior across multiple coupled energy domains. The lumped low-order models, namely macromodels, can help designers both by automating complex sets of related tasks and by providing rapid computational prototyping at critical points in the design cycle [1]. The study aims was to propose a macro model for nonlinear microbolometers to solve the electro-thermal feedback effect of the tiny probe current when measuring. Circuit simulator SPICE was chosen for the framework of simulation, because of the easily integrated with the associated readout circuit.
引用
收藏
页码:79 / +
页数:2
相关论文
共 50 条
  • [41] Electro-thermal Modeling of TCSAW Filter
    Akstaller, Wolfgang
    Kuypers, Jan
    Kokkonen, Kimmo
    Weigel, Robert
    Hagelauer, Amelie
    2018 IEEE INTERNATIONAL ULTRASONICS SYMPOSIUM (IUS), 2018,
  • [42] Compact electro-thermal models of interconnects
    Codecasa, Lorenzo
    MICROELECTRONICS JOURNAL, 2014, 45 (12) : 1777 - 1785
  • [43] Preliminary Characterization of An Electro-Thermal Converter
    Janicki, Marcin
    Jankowski, Mariusz
    Szenner, Michal
    2023 30TH INTERNATIONAL CONFERENCE ON MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEM, MIXDES, 2023, : 160 - 163
  • [44] Analysis of the Fuses' Electro-Thermal Field
    Plesca, A.
    ELEKTRONIKA IR ELEKTROTECHNIKA, 2010, (08) : 85 - 88
  • [45] An electro-thermal paraffin bath.
    Steen, RH
    BRITISH MEDICAL JOURNAL, 1901, 1901 : 1733 - 1734
  • [46] IGBT Electro-thermal Simulation Under Dynamic Avalanche Condition Considering Distribution of Electro-thermal Stress on Chip
    Ma T.
    Luo Y.
    Jia Y.
    Li X.
    Shi Z.
    Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering, 2021, 41 (20): : 7068 - 7078
  • [47] A critical review of thermal models for electro-thermal simulation
    d'Alessandro, V
    Rinaldi, N
    SOLID-STATE ELECTRONICS, 2002, 46 (04) : 487 - 496
  • [48] Thermal networks for electro-thermal analysis of power devices
    Codecasa, L
    D'Amore, D
    Maffezzoni, P
    MICROELECTRONICS JOURNAL, 2001, 32 (10-11) : 817 - 822
  • [49] A Nonlinear Electro-Thermal Scalable Model for High-Power RF LDMOS Transistors
    Wood, John
    Aaen, Peter H.
    Bridges, Daren
    Lamey, Dan
    Guyonnet, Michael
    Chan, Daniel S.
    Monsauret, Nelsy
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2009, 57 (02) : 282 - 292
  • [50] Coupled-domain nonlinear macromodels and pull-in characteristics with electro-thermal effect
    Cheng, SY
    Yu, CC
    Yang, YJ
    BOSTON TRANSDUCERS'03: DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, 2003, : 1104 - 1107