Studies of transverse single-bunch instabilities in booster synchrotrons

被引：3

作者：

Xu, Haisheng ^{[1
]}

Peng, Yuemei ^{[1
]}

Wang, Na ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst High Energy Phys, Key Lab Particle Accelerat Phys & Technol, Beijing, Peoples R China

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2019年 / 940卷

基金：

中国国家自然科学基金;

关键词：

Electron booster synchrotron; Synchrotron light source; Collective effects;

D O I：

10.1016/j.nima.2019.06.048

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The capability of providing full-charge bunches has become an important requirement for quite a few boosters used in ultralow-emittance storage rings based synchrotron light sources. The transverse single-bunch instabilities may limit the single-bunch charge in these type of boosters. The relatively weak synchrotron radiation damping makes the bunch more unstable at the injection energy than at the extraction energy. Therefore, studies of the transverse single-bunch instabilities are carried out first at the injection energy, with the chromaticity varied, to understand how the threshold changes accordingly. Our studies show that the single-bunch threshold current tends to drop when the chromaticity becomes nonzero at the injection energy of the used booster lattice. The corresponding simulation results are presented and analyzed. Furthermore, the transverse single-bunch instabilities during the energy ramping process are also studied.

引用

页码：313 / 319

页数：7

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