Integration of intensity and angle calibration into Rietveld refinement

被引：2
作者：
Schneider, J [1 ]
Kern, A [1 ]
机构：
[1] UNIV HEIDELBERG,INST MINERAL,D-69120 HEIDELBERG,GERMANY
来源：
EUROPEAN POWDER DIFFRACTION: EPDIC IV, PTS 1 AND 2 | 1996年 / 228卷
关键词：
Rietveld method; angle calibration; intensity calibration; instrument bias;
D O I：
10.4028/www.scientific.net/MSF.228-231.35
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Incorporation of intensity and angle calibration functions as ''experimental models'' of systematic instrument aberrations into Rietveld analysis is shown to be a valid and comfortable way to remove instrument bias from refined structural parameters.
引用
收藏
页码：35 / 38
页数：4
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