Integration of intensity and angle calibration into Rietveld refinement

被引:2
作者
Schneider, J [1 ]
Kern, A [1 ]
机构
[1] UNIV HEIDELBERG,INST MINERAL,D-69120 HEIDELBERG,GERMANY
来源
EUROPEAN POWDER DIFFRACTION: EPDIC IV, PTS 1 AND 2 | 1996年 / 228卷
关键词
Rietveld method; angle calibration; intensity calibration; instrument bias;
D O I
10.4028/www.scientific.net/MSF.228-231.35
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Incorporation of intensity and angle calibration functions as ''experimental models'' of systematic instrument aberrations into Rietveld analysis is shown to be a valid and comfortable way to remove instrument bias from refined structural parameters.
引用
收藏
页码:35 / 38
页数:4
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