Large area gratings by x-ray LIGA dynamic exposure for x-ray phase-contrast imaging

被引:15
作者
Schroeter, Tobias J. [1 ]
Koch, Frieder [1 ]
Meyer, Pascal [1 ]
Baumann, Martin [1 ]
Muench, Daniel [1 ]
Kunka, Danays [1 ]
Engelhardt, Sabine [2 ,3 ]
Zuber, Marcus [2 ,3 ]
Baumbach, Tilo [2 ,3 ]
Mohr, Juergen [1 ]
机构
[1] Karlsruhe Inst Technol, Inst Microstruct Technol, Hermann von Helmholtz Pl 1, D-76344 Eggenstein Leopoldshafen, Germany
[2] Karlsruhe Inst Technol, Inst Photon Sci & Synchrotron Radiat, Hermann von Helmholtz Pl 1, D-76344 Eggenstein Leopoldshafen, Germany
[3] Karlsruhe Inst Technol, Lab Applicat Synchrotron Radiat, Hermann von Helmholtz Pl 1, D-76344 Eggenstein Leopoldshafen, Germany
来源
JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS | 2017年 / 16卷 / 01期
关键词
x-ray; imaging; grating; lithographie; galvanik und abformung; lithography; LITHOGRAPHY; FABRICATION;
D O I
10.1117/1.JMM.16.1.013501
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
X-ray differential phase-contrast imaging (DPCI) using a Talbot-Lau interferometer at a conventional tube source has continuously found applications since its first demonstration. It requires high aspect ratio grating structures with a feature size in the micrometer range that are fabricated using lithographie, galvanik und abformung technology. To overcome the current limitation in grating area, an exposure strategy-continuous exposure-has been developed. In this case, the mask is fixed in respect to the synchrotron beam and only the substrate is scanned. Thus, the grating area is given by the scanning length which is much larger than the actual mask size. The design, needs, and tolerances to adopt this process of dynamic exposure will be described. Furthermore, the first tests using this method will be presented. Gratings with a metal aspect ratio of 11 and a period of 10 mu m were fabricated on an area of 165 mm x 65 mm. First imaging results demonstrate the suitability of this method. No differences in the visibility or in x-ray image compared to gratings fabricated by the standard method could be found. (C) 2017 Society of Photo-Optical Instrumentation Engineers (SPIE)
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页数:6
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