Ferroelectric film switching via oblique domain growth observed by cross-sectional nanoscale imaging

被引:15
作者
Gysel, Roman [1 ]
Tagantsev, Alexander K.
Stolichnov, Igor
Setter, Nava
Pavius, Michael
机构
[1] Ecole Polytech Fed Lausanne, Ceram Lab, CH-1015 Lausanne, Switzerland
[2] Ecole Polytech Fed Lausanne, Ctr MicroNanotechnol, CH-1015 Lausanne, Switzerland
关键词
D O I
10.1063/1.2338432
中图分类号
O59 [应用物理学];
学科分类号
摘要
Different stages of polarization reversal in a Pb(Zr,Ti)O-3 ferroelectric film have been directly observed using a technique of cross-sectional piezoelectric force imaging. Analysis of the local piezoelectric response measured across the cross section strongly suggests that polarization reversal occurs via oblique domain growth rather than by growth of domains perpendicular to the film plane. The proposed approach represents a valuable extension to the piezoelectric force microscopy (PFM) and contributes to a better understanding of results observed using more standard techniques. Particularly, oblique domain growth explains the gradual variation of piezoelectric response amplitude commonly observed in planar PFM images. (c) 2006 American Institute of Physics.
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页数:3
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