Atomic force microscopy and scanning tunneling microscopy of rubbed polyimide surfaces.

被引:0
|
作者
Devlin, C [1 ]
Chiang, S [1 ]
机构
[1] UNIV CALIF DAVIS,DEPT PHYS,DAVIS,CA 95616
来源
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1997年 / 213卷
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暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
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页码:387 / POLY
页数:2
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