Equilibrium shapes and properties of epitaxially strained islands

被引:144
作者
Spencer, BJ [1 ]
Tersoff, J [1 ]
机构
[1] IBM CORP,DIV RES,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
关键词
D O I
10.1103/PhysRevLett.79.4858
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We calculate the equilibrium morphology of an epitaxial strained layer which wets the substrate (Stranski-Krastanow growth), in a two-dimensional continuum model. The layer coalesces into a single discrete island, with zero contact angle to the film wetting the substrate. Small islands have a minimum width, and hence an arbitrarily small aspect ratio. Very large coherent islands have a shape that approaches a ball sitting atop the wetting layer.
引用
收藏
页码:4858 / 4861
页数:4
相关论文
共 31 条
[1]   INTERFACE MORPHOLOGY DEVELOPMENT DURING STRESS-CORROSION CRACKING .1. VIA SURFACE DIFFUSION [J].
ASARO, RJ ;
TILLER, WA .
METALLURGICAL TRANSACTIONS, 1972, 3 (07) :1789-&
[2]  
CHIU CH, 1995, MATER RES SOC SYMP P, V356, P33
[3]  
DUPORT C, 1997, MORPHOLOGICAL ORG EP
[4]   INSTABILITY OF A BIAXIALLY STRESSED THIN-FILM ON A SUBSTRATE DUE TO MATERIAL DIFFUSION OVER ITS FREE-SURFACE [J].
FREUND, LB ;
JONSDOTTIR, F .
JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 1993, 41 (07) :1245-1264
[5]   EVOLUTION OF WAVINESS ON THE SURFACE OF A STRAINED ELASTIC SOLID DUE TO STRESS-DRIVEN DIFFUSION [J].
FREUND, LB .
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 1995, 32 (6-7) :911-923
[6]  
FREUND LB, 1996, MATER RES SOC S P, V399, P2359
[7]   SOME GENERAL-PROPERTIES OF STRESS-DRIVEN SURFACE EVOLUTION IN A HETEROEPITAXIAL THIN-FILM STRUCTURE [J].
GAO, HJ .
JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 1994, 42 (05) :741-772
[8]   SURFACE STRAINS IN EPITAXIAL SYSTEMS [J].
GRAY, LJ ;
CHISHOLM, MF ;
KAPLAN, T .
APPLIED PHYSICS LETTERS, 1995, 66 (15) :1924-1926
[9]  
Grinfel'd M. A., 1986, Soviet Physics - Doklady, V31, P831
[10]   DIRECT IMAGING OF SURFACE CUSP EVOLUTION DURING STRAINED-LAYER EPITAXY AND IMPLICATIONS FOR STRAIN RELAXATION [J].
JESSON, DE ;
PENNYCOOK, SJ ;
BARIBEAU, JM ;
HOUGHTON, DC .
PHYSICAL REVIEW LETTERS, 1993, 71 (11) :1744-1747