Bi vacancy formation in BiFeO3 epitaxial thin films under compressive (001)-strain from first principles

被引:11
|
作者
Xia, Lu [1 ]
Tybell, Thomas [2 ]
Selbach, Sverre M. [1 ]
机构
[1] NTNU Norwegian Univ Sci & Technol, Dept Mat Sci & Engn, N-7491 Trondheim, Norway
[2] NTNU Norwegian Univ Sci & Technol, Dept Elect Syst, N-7491 Trondheim, Norway
关键词
FERROELECTRIC PROPERTIES; ELECTRICAL-CONDUCTIVITY; STRAIN; STABILITY; DEFECTS; CRYSTAL; OXIDE;
D O I
10.1039/c8tc06608f
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Point defects in BiFeO3 affect both structural and functional properties. To elucidate the role of single Bi vacancies and Bi-O vacancy pairs we investigate their stability and effect on structural and ferroelectric properties in BiFeO3 using first principles density functional theory calculations. Compressive strain is shown to stabilize Bi vacancies, and the Bi vacancy enthalpy of formation drops abruptly at the structural transition from rhombohedral R-phase to tetragonal T-phase. For Bi-O vacancy pairs the situation is more complex, albeit stabilization is found under compressive strain. Out-of-plane oriented vacancy pairs are stabilized in the T-phase, while in-plane oriented vacancy pairs are destabilized compared to the R-phase. It is shown that single Bi vacancies do not affect the spontaneous polarization, while in-plane Bi-O vacancy pairs reduce the in-plane component of the polarization, resulting in a polarization rotation towards [001]. We also discuss the effect of vacancies on the electronic properties of BiFeO3, and show that Bi deficiency is consistent with the experimentally reported p-type conductivity.
引用
收藏
页码:4870 / 4878
页数:9
相关论文
共 50 条
  • [31] Tailoring the domain structure of epitaxial BiFeO3 thin films
    Giencke, Jon E.
    Folkman, Chad M.
    Baek, Seung-Hyub
    Eom, Chang-Beom
    CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 2014, 18 (01): : 39 - 45
  • [32] Effects of La substitution for BiFeO3 epitaxial thin films
    K. Wakazono
    Y. Kawahara
    K. Ujimoto
    T. Yoshimura
    N. Fujimura
    Journal of the Korean Physical Society, 2013, 62 : 1069 - 1072
  • [33] Reversible plasma switching in epitaxial BiFeO3 thin films
    Kim, Yunseok
    Vrejoiu, Ionela
    Hesse, Dietrich
    Alexe, Marin
    APPLIED PHYSICS LETTERS, 2010, 96 (20)
  • [34] Properties of (001) NaNbO3 films under epitaxial strain: A first-principles study
    Patel, Kinnary
    Prosandeev, Sergey
    Xu, Bin
    Xu, Changsong
    Bellaiche, L.
    PHYSICAL REVIEW B, 2021, 103 (09)
  • [35] First-principles study on the formation of a vacancy in Ge under biaxial compressive strain
    Choi, Jung-Hae
    Na, Kwang-Duk
    Lee, Seung-Cheol
    Hwang, Cheol Seong
    THIN SOLID FILMS, 2010, 518 (22) : 6373 - 6377
  • [36] Origin of antipolar clusters in BiFeO3 epitaxial thin films
    Liu, Bin
    Yang, Chengpeng
    Li, Xiaotian
    Wang, Chao
    Liu, Guiju
    Yang, Huaiwen
    Wang, Yiqian
    JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2018, 38 (02) : 621 - 627
  • [37] Effects of La substitution for BiFeO3 epitaxial thin films
    Wakazono, K.
    Kawahara, Y.
    Ujimoto, K.
    Yoshimura, T.
    Fujimura, N.
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2013, 62 (07) : 1069 - 1072
  • [38] Growth rate induced monoclinic to tetragonal phase transition in epitaxial BiFeO3 (001) thin films
    Liu, Huajun
    Yang, Ping
    Yao, Kui
    Wang, John
    APPLIED PHYSICS LETTERS, 2011, 98 (10)
  • [39] Crystal Structures and Electrical Properties of Epitaxial BiFeO3 Thin Films with (001), (110), and (111) Orientations
    Sone, Keita
    Naganuma, Hiroshi
    Miyazaki, Takamichi
    Nakajima, Takashi
    Okamura, Soichiro
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2010, 49 (09)
  • [40] Stripe domain structure in epitaxial (001) BiFeO3 thin films on orthorhombic TbScO3 substrate
    Folkman, C. M.
    Baek, S. H.
    Jang, H. W.
    Eom, C. B.
    Nelson, C. T.
    Pan, X. Q.
    Li, Y. L.
    Chen, L. Q.
    Kumar, A.
    Gopalan, V.
    Streiffer, S. K.
    APPLIED PHYSICS LETTERS, 2009, 94 (25)