Application of constant current pulse to suppress bubble incorporation and control deposit morphology during aqueous electrophoretic deposition (EPD)

被引:60
作者
Besra, L. [1 ]
Uchikoshi, T. [1 ]
Suzuki, T. S. [1 ]
Sakka, Y. [1 ]
机构
[1] Natl Inst Mat Sci, Nano Ceram Ctr, Fine Particle Proc Grp, WPI Ctr Initiat Mat Nanoarchitechtron, Tsukuba, Ibaraki 3050047, Japan
关键词
Suspensions; Al2O3; Electrophoretic deposition; Pulse current; ZINC-OXIDE SUSPENSIONS; THIN-FILMS; COMPOSITES; CERAMICS; NICKEL; ALLOYS;
D O I
10.1016/j.jeurceramsoc.2008.07.031
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Electrophoretic deposition (EPD) from aqueous suspension generally forms deposits containing enormous pores because of evolution of hydrogen gas at cathode and oxygen at anode due to electrolysis of water on application of DC electric field. We have demonstrated through this investigation on aqueous EPD of alumina suspension as an example that application of pulsed DC instead of the conventionally used continuous DC is a convenient and effective way to control and suppress the amount of bubble incorporation in the deposit. Bubble-free deposits of reasonable yield were obtained at suitable pulse widths and/or duty cycle. The deposit yield and bubble incorporation decreased progressively with decrease in the pulse width and duty cycle of the applied pulse current. A characteristic deposition window was found in the current vs. pulse width plot within which smooth and bubble-free deposits are obtained. The window is wider at low-applied currents compared to that at higher currents implying that it is easier to control the pulsed EPD at lower applied currents. No deposition occurred below the window whereas deposits with incorporated bubbles formed above the window. Possible mechanisms involved in pulsed EPD have been advocated on the basis of amount of hydrogen evolved/pulse due to the electrolysis of water. The discrete amount of H-2 evolved/pulse was higher for larger pulse widths leading to incorporation of more bubbles and vice versa. This was verified by monitoring the gain in weight of palladium (Pd) electrode used as cathode for electrolysis experiment since it is known to absorb hydrogen. (C) 2009 Published by Elsevier Ltd.
引用
收藏
页码:1837 / 1845
页数:9
相关论文
共 40 条
[11]   Nanocrystalline Ni-Cu alloy plating by pulse electrolysis [J].
Ghosh, SK ;
Grover, AK ;
Dey, GK ;
Totlani, MK .
SURFACE & COATINGS TECHNOLOGY, 2000, 126 (01) :48-63
[12]  
Hamaker HC., 1940, T FARADAY SOC, V36, P279
[13]   Electrophoretic deposition to control artificial opal growth [J].
Holgado, M ;
García-Santamaría, F ;
Blanco, A ;
Ibisate, M ;
Cintas, A ;
Míguez, H ;
Serna, CJ ;
Molpeceres, C ;
Requena, J ;
Mifsud, A ;
Meseguer, F ;
López, C .
LANGMUIR, 1999, 15 (14) :4701-4704
[14]   Innovation of novel functional material processing technique by using electrophoretic deposition process [J].
Kanamura, K ;
Hamagami, J .
SOLID STATE IONICS, 2004, 172 (1-4) :303-308
[15]   Electrodeposition of cobalt-iron alloys in pulsed current from electrolytes containing organic additives [J].
Lallemand, F ;
Ricq, L ;
Deschaseaux, E ;
De Vettor, L ;
Berçot, P .
SURFACE & COATINGS TECHNOLOGY, 2005, 197 (01) :10-17
[16]   Characterization of pulse plated Cu2O thin films [J].
Mahalingam, T ;
Chitra, JSP ;
Ravi, G ;
Chu, JP ;
Sebastian, PJ .
SURFACE & COATINGS TECHNOLOGY, 2003, 168 (2-3) :111-114
[17]  
MIU WS, 1988, Patent No. 4789437
[18]   Effect of the slurry properties on the homogeneity of alumina deposits obtained by aqueous electrophoretic deposition [J].
Moreno, R ;
Ferrari, B .
MATERIALS RESEARCH BULLETIN, 2000, 35 (06) :887-897
[19]   Electrophoretic deposition mechanism of YSZ/n-propanol suspension [J].
Negishi, H ;
Yamaji, K ;
Imura, T ;
Kitamoto, D ;
Ikegami, T ;
Yanagishita, H .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2005, 152 (02) :J16-J22
[20]   Pulse and direct current plating of Ni-W alloys from ammonia-citrate electrolyte [J].
Obradovic, MD ;
Bosnjakov, GZ ;
Stevanovic, RM ;
Maksimovic, MD ;
Despic, AR .
SURFACE & COATINGS TECHNOLOGY, 2006, 200 (14-15) :4201-4207