Direct wiring of carbon nanotubes for integration in nanoelectromechanical systems

被引:24
作者
Bauerdick, S.
Linden, A.
Stampfer, C.
Helbling, T.
Hierold, C.
机构
[1] Raith, Res & Dev, D-44227 Dortmund, Germany
[2] ETH, CH-8092 Zurich, Switzerland
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2006年 / 24卷 / 06期
关键词
D O I
10.1116/1.2388965
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The authors present the use of electron beam induced deposition (EBID) for direct wiring of carbon nanotubes (CNTs). Since this technique is a maskless, direct patterning method, EBID is applicable to suspended nanotubes potentially integrated in predefined nanoelectromechanical systems (NEMS). The authors developed a process including CNT adsorption from solution on prepatterned planar samples, evaluation and localization of CNTs by scanning force microscopy, preparation of GDSII layouts, and contacting CNTs by EBID of tungsten. EBID was performed in an integrated e-beam lithography and nanoengineering workstation using tungsten hexacarbonyl as precursor. With well controlled exposure conditions, a resistivity on the order of 10(-2) ohm cm has been achieved. Moreover, electrical measurements on CNTs contacted by EBID tungsten leads clearly show transistorlike behavior. First tests on EBID metal lead integration on alumina NEMS structures were carried out. Thus EBID can enable a top metallization of CNTs on suspended NEMS structures, which should enhance also the mechanical stability between the lead and the CNT. (c) 2006 American Vacuum Society,
引用
收藏
页码:3144 / 3147
页数:4
相关论文
共 16 条
[1]   Electrodes for carbon nanotube devices by focused electron beam induced deposition of gold [J].
Brintlinger, T ;
Fuhrer, MS ;
Melngailis, J ;
Utke, I ;
Bret, T ;
Perentes, A ;
Hoffmann, P ;
Abourida, M ;
Doppelt, P .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2005, 23 (06) :3174-3177
[2]  
Cleland A. N., 2003, FDN NANOMECHANICS
[3]   Nanoelectromechanical systems [J].
Craighead, HG .
SCIENCE, 2000, 290 (5496) :1532-1535
[4]   Visualization and in situ contacting of carbon nanotubes in a scanning electron microscope [J].
Croitoru, MD ;
Bertsche, G ;
Kern, DR ;
Burkhardt, C ;
Bauerdick, S ;
Sahakalkan, S ;
Roth, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2005, 23 (06) :2789-2792
[5]   Integration of suspended carbon nanotube arrays into electronic devices and electromechanical systems [J].
Franklin, NR ;
Wang, Q ;
Tombler, TW ;
Javey, A ;
Shim, M ;
Dai, HJ .
APPLIED PHYSICS LETTERS, 2002, 81 (05) :913-915
[6]   Process integration of carbon nanotubes into microelectromechanical systems [J].
Jungen, Alain ;
Stampfer, Christoph ;
Hoetzel, Jochen ;
Bright, Victor M. ;
Hierold, Christofer .
SENSORS AND ACTUATORS A-PHYSICAL, 2006, 130 :588-594
[7]   HIGH-RESOLUTION ELECTRON-BEAM INDUCED DEPOSITION [J].
KOOPS, HWP ;
WEIEL, R ;
KERN, DP ;
BAUM, TH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (01) :477-481
[8]   A three-terminal carbon nanorelay [J].
Lee, SW ;
Lee, DS ;
Morjan, RE ;
Jhang, SH ;
Sveningsson, M ;
Nerushev, OA ;
Park, YW ;
Campbell, EEB .
NANO LETTERS, 2004, 4 (10) :2027-2030
[9]   Carbon nanotube oscillators toward zeptogram detection [J].
Nishio, M ;
Sawaya, S ;
Akita, S ;
Nakayama, Y .
APPLIED PHYSICS LETTERS, 2005, 86 (13) :1-3
[10]  
REICH S, 2003, CARBON NANOTUBES