Near-field polarimetric characterization of polymer crystallites

被引：3
作者：
Goldner, LS
Goldie, SN
Fasolka, MJ
Renaldo, F
Hwang, J
Douglas, JF
机构：
[1] Natl Inst Stand & Technol, Phys Lab, Opt Technol Div, Gaithersburg, MD 20899 USA
[2] Natl Inst Stand & Technol, Mat Sci & Engn Lab, Div Polymers, Gaithersburg, MD 20899 USA
来源：
APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 08期
关键词：
D O I：
10.1063/1.1785866
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We use near-field polarimetry (NFP) to investigate thin-film crystallites of isotactic polystyrene (iPS). NFP micrographs enable quantitative optical characterization of the birefringence in these specimens with subdiffraction-limited resolution, resulting in observations that give: (1) evidence for radial strain in the depletion boundary surrounding the growth front, and (2) a map of local tilt in the crystal axis and/or strain in the amorphous layers above and below the growth plane of the crystallites.
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收藏
页码：1338 / 1340
页数：3
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