Images of a photoelectron interfering with itself: the photodetachment microscope

被引：4

作者：

Blondel, Christophe ^{[1
]}

Chaibi, Walid ^{[1
]}

Delsart, Christian ^{[1
]}

Drag, Cyril ^{[1
]}

机构：

[1] CNRS, Aime Cotton Lab, F-91405 Orsay, France

来源：

JOURNAL OF MODERN OPTICS | 2006年 / 53卷 / 16-17期

关键词：

D O I：

10.1080/09500340600898163

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An electron emitted from a pointlike source, when submitted to uniform acceleration by an electric field, can follow several trajectories to the point where it is detected. The corresponding interference pattern has been observed in a photodetachment experiment. Fitting the pattern with the squared Green function of the uniform acceleration problem makes it possible to perform electron spectrometry with a 1 mu eV accuracy. This has been used for electron affinity measurements, both on atomic anions and with a molecular one.

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页码：2605 / 2607

页数：3

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