Low-Cycle Fatigue Testing of Ni Nanowires Based on a Micro-Mechanical Device

被引:23
作者
Zhang, H. [1 ,2 ]
Jiang, C. [1 ]
Lu, Y. [1 ,2 ]
机构
[1] City Univ Hong Kong, Dept Mech & Biomed Engn, Kowloon, Hong Kong, Peoples R China
[2] City Univ Hong Kong, CASM, Shenzhen Res Inst, Shenzhen 518057, Peoples R China
基金
中国国家自然科学基金;
关键词
Fatigue; Nanowire; In situ tensile testing; Cyclic deformation; Micro-mechanical device; Nanomechanics; TRANSMISSION ELECTRON-MICROSCOPY; MECHANICAL-PROPERTIES; SI NANOWIRES; PLASTICITY; FILMS; NANOINDENTATION; DYNAMICS; SILICON; STRAIN;
D O I
10.1007/s11340-016-0199-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Despite extensive research on the mechanical properties of one-dimensional (1-D) nanomaterials such as nanowires and nanotubes in the past two decades, experimental data on the fatigue behavior of 1-D building blocks are still very limited. Here, we demonstrate the first quantitative in situ tensile fatigue testing of individual nanowires inside a high-resolution scanning electron microscope (SEM), based on the nanoindenter-assisted "push-to-pull" dynamic tensile straining mechanism. With the robust micro-mechanical devices and independent quantitative nanoindenter for actuation and force sensing, we achieved both stress- and strain-controlled cyclic tensile loading on nanowire samples with variable loading frequencies up to 10 Hz, and demonstrated the low-cycle fatigue behavior of pristine single crystalline nickel (Ni) nanowires.
引用
收藏
页码:495 / 500
页数:6
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