High-refractive-index gratings for spectroscopic and Laser applications

被引:10
作者
Zeitner, Uwe D. [1 ,2 ]
Fuchs, Frank [2 ]
Kley, E. -Bernhard [1 ]
Tuennermann, Andreas [1 ,2 ]
机构
[1] Univ Jena, Abbe Ctr Photon, Inst Appl Phys, A Einstein Str 15, D-07743 Jena, Germany
[2] Fraunhofer Inst Appl Opt & Precis Engn, D-07745 Jena, Germany
来源
HIGH CONTRAST METASTRUCTURES III | 2014年 / 8995卷
关键词
grating; e-beam lithography; atomic-layer-deposition; pulse compression; spectroscopy;
D O I
10.1117/12.2041729
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Fabrication of high performance gratings may significantly benefit from the use of high index materials such as Ta2O5, TiO2 or Al2O3. However, these materials can typically not be patterned with the required quality by common etching processes. To overcome this limitation we developed novel grating fabrication technologies based on a combination of conventional lithography with Atomic-Layer-Deposition. For that the basic structure of the grating is first realized in a fused-silica substrate or a SiO2-layer. This template is then functionalized by an ALD-coating in a specific pre-defined manner. The new approach opens up a huge variety of new options for the realization of gratings whose fabrication would otherwise not be possible.
引用
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页数:7
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