In Situ TEM of Electrochemical Incidents: Effects of Biasing and Electron Beam on Electrochemistry

被引：24

作者：

Han, Chaoya ^{[1
]}

Islam, Md Tariqul ^{[1
]}

Ni, Chaoying ^{[1
]}

机构：

[1] Univ Delaware, Dept Mat Sci & Engn, Newark, DE 19716 USA

来源：

ACS OMEGA | 2021年 / 6卷 / 10期

关键词：

ION BATTERIES; MICROSCOPY; VISUALIZATION; GROWTH; DEGRADATION; CHALLENGES; LITHIATION; SPECIMENS; NI;

D O I：

10.1021/acsomega.0c05829

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

In situ TEM utilizing specialized holders and MEMS chips allows the investigation of the interaction, evolution, property, and function of nanostructures and devices responding to designed environments and/or stimuli. This mini-review summarizes the recent progress of in situ TEM with a liquid cell and a flow channel for the investigation of interactions among aqueous nanoparticles, electrolytes, and electrodes under the influence of electric bias and electron beam. A focus is made on nanoparticle growth by electrodeposition, particle nucleation induced by electric biasing or electron beam, self-assembly, and electrolyte breakdown. We also outline some future opportunities of in situ TEM with aqueous cells and flow.

引用

页码：6537 / 6546

页数：10

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