Two step synthesis of vanadium pentoxide thin films for optoelectronic applications

被引:12
作者
George, Amal [1 ]
Raj, A. Dhayal [1 ]
Irudayaraj, A. Albert [1 ]
Raj, D. Magimai Antoni [1 ]
Venci, X. [2 ]
Jayakumar, G. [1 ]
Arumugam, J. [1 ]
Kumar, M. Senthil [3 ]
Sundaram, S. John [1 ]
Kaviyarasu, K. [4 ,5 ]
机构
[1] Sacred Heart Coll Autonomous, Dept Phys, Tirupattur 635601, Tamil Nadu, India
[2] Auxilium Coll, Dept Phys, Vellore 635601, Tamil Nadu, India
[3] Karunya Inst Sci & Technol, Dept Appl Phys, Coimbatore 641146, Tamil Nadu, India
[4] Univ South Africa UNISA, Coll Grad Studies, UNESCO UNISA Africa Chair Nanosci Nanotechnol Lab, POB 392, Pretoria, South Africa
[5] Natl Res Fdn NRF, iThemba LABS, Mat Res Grp MRG, Nanosci African Network NANOAFNET, 1 Old Faure Rd, ZA-7129 Somerset West, Western Cape Pr, South Africa
关键词
V2O5; Solvothermal method; Dip coating process; Nanosphere; Bandgap; ELECTRICAL-CONDUCTIVITY; OPTICAL-PROPERTIES; ZNO NANORODS; HETEROSTRUCTURES; ORIENTATION; TEMPERATURE; GROWTH;
D O I
10.1016/j.matpr.2020.05.104
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
While comparing with other materials, vanadium pentoxide nanostructures have drawn a great attentiveness due to their high stability and vast applications including solar cells, gas sensors, optoelectronic devices and so on. In this current work, V2O5 is prepared by solvothermal synthesis at a constant temperature. The prepared vanadium pentoxide powder is again used to deposit vanadium pentoxide thin films by dip coating method. The structural, morphological and optical studies of the prepared vanadium pentoxide thin films are investigated using X-ray diffractometer (XRD), Scanning Electron Microscope (SEM) and UV-Visible Spectroscope (UV-Vis). The x-ray diffraction studies reveal that the crystallites in vanadium pentoxide film have orthorhombic structure. The appearance of nanosphere like structures on the sample surface with increasing film thickness and number of dipping is confirmed from the SEM analysis. The UV-Vis study showed that bandgap of the material is increases with increasing dipping. These studies provide a clear outlook on the properties of vanadium pentoxide thin films. (C) 2019 Elsevier Ltd. All rights reserved.
引用
收藏
页码:464 / 467
页数:4
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