Temperature dependent deformation analysis of ceramic ball grid array package assembly under accelerated thermal cycling condition

被引:21
作者
Cho, SM [1 ]
Han, BT
Joo, J
机构
[1] Univ Maryland, Dept Mech Engn, CALCE Elect Prod & Syst Ctr, College Pk, MD 20742 USA
[2] Chungbuk Natl Univ, Dept Mech Engn, Cheongju Chungbuk, South Korea
关键词
D O I
10.1115/1.1646426
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A robust scheme of moire interferometry for real-time observation is employed to study the temperature dependent thermo-mechanical behavior of a ceramic ball grid array package assembly. The scheme is implemented with a convection-type environmental chamber that provides the rapid temperature control required in accelerated thermal cycling. Thermal deformations are documented at various temperatures. Thermal-history dependent analyses of global and local deformations are presented. A significant nonlinear global behavior is documented due to complete stress relaxation at the maximum temperature. An analysis of solder interconnections reveals that inelastic deformation accumulates at the bottom eutectic solder fillet only at high temperatures.
引用
收藏
页码:41 / 47
页数:7
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