Optical and transport properties of ultrathin NbN films and nanostructures

被引:154
作者
Semenov, A. [1 ]
Guenther, B. [1 ]
Boettger, U. [1 ]
Huebers, H. -W. [1 ]
Bartolf, H. [2 ]
Engel, A. [2 ]
Schilling, A. [2 ]
Ilin, K. [3 ]
Siegel, M. [3 ]
Schneider, R. [4 ]
Gerthsen, D. [4 ]
Gippius, N. A. [5 ,6 ]
机构
[1] DLR Inst Planetary Res, D-12489 Berlin, Germany
[2] Univ Zurich, Inst Phys, CH-8057 Zurich, Switzerland
[3] Univ Karlsruhe, Inst Micro & Nanoelect Syst, D-76187 Karlsruhe, Germany
[4] Univ Karlsruhe, Lab Elect Microscopy, D-76128 Karlsruhe, Germany
[5] Univ Blaise Pascal, CNRS, UMR 6602, LASMEA, F-63177 Aubiere, France
[6] Russian Acad Sci, AM Prokhorov Gen Phys Inst, Moscow 119991, Russia
关键词
critical current density (superconductivity); electronic density of states; ellipsometry; Fermi level; fluctuations in superconductors; infrared spectra; nanofabrication; nanowires; niobium compounds; optical constants; penetration depth (superconductivity); sputter deposition; superconducting materials; superconducting thin films; superconducting transition temperature; PURITY DEPENDENCE; SINGLE-PHOTON; TEMPERATURE; ABSORPTION; STATE;
D O I
10.1103/PhysRevB.80.054510
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Optical and transport properties of a series of ultrathin NbN films with different thickness grown on sapphire have been evaluated by means of spectral ellipsometry and dc measurements of superconducting critical parameters. The growth process and thus the nitrogen content have been optimized for each film in the series to achieve the highest superconducting transition temperature, which however increases with the film thickness. Optical and transport measurements agree in slowly increasing disorder while the electron density of states at the Fermi level shows a twofold decrease when the film thickness drops from 14 to 3 nm. Near-infrared extinction spectra of nanowire gratings from our films are well described by the scattering matrix method that uses optical parameters of nonstructured films and the grating geometry. The technique provides an attractive tool for analyzing various devices for nanophotonics.
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页数:10
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