Enhanced compositional sensitivity in atomic force microscopy by the excitation of the first two flexural modes

被引：141

作者：

Martinez, N. F. ^{[1
]}

Patil, S. ^{[1
]}

Lozano, J. R. ^{[1
]}

Garcia, R. ^{[1
]}

机构：

[1] CSIC, Inst Microelect, Madrid 28760, Spain

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 15期

关键词：

D O I：

10.1063/1.2360894

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The authors demonstrate that the compositional sensitivity of an atomic force microscope is enhanced by the simultaneous excitation of its first two flexural eigenmodes. The coupling of those modes by the nonlinear probe-surface interactions enables to map compositional changes in several conjugated molecular materials with a phase shift sensitivity that is about one order of magnitude higher than the one achieved in amplitude modulation atomic force microscopy. (c) 2006 American Institute of Physics.

引用

页数：3

共 27 条

[1]

[Anonymous], 1992, INTERMOLECULAR SURFA

[2] Ultra-sensitive imaging and interfacial analysis of patterned hydrophilic SAM surfaces using energy dissipation chemical force microscopy [J].