Intense photoluminescence of porous layers of SiC films grown on silicon substrates

被引:13
作者
Danishevskii, AM
Shuman, VB
Guk, EG
Rogachev, AY
机构
[1] A. F. Ioffe Physicotechnical Inst., Russian Academy of Sciences
关键词
D O I
10.1134/1.1187162
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Luminescing porous layers have been prepared on SiC films grown on silicon substrates. The intensity of the photoluminescence increases very strongly as a result of electrolytic oxidation of porous layers. The spectrum of the pulsed photoluminescence consists of a series of overlapping bands from 1.8 to 3.3 eV. Investigations of the initial SiC films showed that they are nonstoichiometric and strongly disordered. Nonetheless, the intensity of the photoluminescence of the oxidized porous layers is much higher than can be obtained from correspondingly treated SiC crystals or crystalline films. (C) 1997 American Institute of Physics.
引用
收藏
页码:354 / 358
页数:5
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