Photocurrent collection efficiency mapping of a silicon solar cell by a differential luminescence imaging technique

被引:19
作者
Rau, U. [1 ]
Huhn, V. [1 ]
Stoicescu, L. [2 ]
Schneemann, M. [1 ]
Augarten, Y. [1 ]
Gerber, A. [1 ]
Pieters, B. E. [1 ]
机构
[1] Forschungszentrum Julich, IEK5 Photovolta, D-52425 Julich, Germany
[2] Univ Stuttgart, Inst Photovolta, D-70569 Stuttgart, Germany
关键词
ELECTROLUMINESCENCE;
D O I
10.1063/1.4898008
中图分类号
O59 [应用物理学];
学科分类号
摘要
A differential electroluminescence imaging method for solar cells which yields local photocurrent collection efficiency maps is introduced. These maps attribute a value between zero and unity to each location on the cell. This value corresponds to the ratio between the current at the cell terminals and the locally generated photocurrent. The method is demonstrated for a multicrystalline silicon solar cell under constant illumination. If the point of maximum power output of the cell is chosen as the bias point, the method yields quantitative information on the local contribution to the maximum output power of the solar cell. (C) 2014 AIP Publishing LLC.
引用
收藏
页数:4
相关论文
共 22 条
[1]   Calculation of quantitative shunt values using photoluminescence imaging [J].
Augarten, Yael ;
Trupke, Thorsten ;
Lenio, Martha ;
Bauer, Jan ;
Weber, Juergen W. ;
Juhl, Matthias ;
Kasemann, Martin ;
Breitenstein, Otwin .
PROGRESS IN PHOTOVOLTAICS, 2013, 21 (05) :933-941
[2]   Quantitative Luminescence Characterization of Crystalline Silicon Solar Cells [J].
Bothe, Karsten ;
Hinken, David .
ADVANCES IN PHOTOVOLTAICS, PT 2, 2013, 89 :259-339
[3]   Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence [J].
Fuyuki, T ;
Kondo, H ;
Yamazaki, T ;
Takahashi, Y ;
Uraoka, Y .
APPLIED PHYSICS LETTERS, 2005, 86 (26) :1-3
[4]   Spatially Resolved Characterization of Silicon As-Cut Wafers with Photoluminescence Imaging [J].
Giesecke, Johannes A. ;
The, Manuel ;
Kasemann, Martin ;
Warta, Wilhelm .
PROGRESS IN PHOTOVOLTAICS, 2009, 17 (04) :217-225
[5]   Evaluating luminescence based voltage images of silicon solar cells [J].
Glatthaar, M. ;
Haunschild, J. ;
Zeidler, R. ;
Demant, M. ;
Greulich, J. ;
Michl, B. ;
Warta, W. ;
Rein, S. ;
Preu, R. .
JOURNAL OF APPLIED PHYSICS, 2010, 108 (01)
[6]   Spatially resolved determination of dark saturation current and series resistance of silicon solar cells [J].
Glatthaar, Markus ;
Haunschild, Jonas ;
Kasemann, Martin ;
Giesecke, Johannes ;
Warta, Wilhelm ;
Rein, Stefan .
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2010, 4 (1-2) :13-15
[7]   Modeling of spatially inhomogeneous solar cells by a multi-diode approach [J].
Grabitz, PO ;
Rau, U ;
Werner, JH .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2005, 202 (15) :2920-2927
[8]   Quantitative electroluminescence analysis of resistive losses in Cu(In, Ga)Se2 thin-film modules [J].
Helbig, Anke ;
Kirchartz, Thomas ;
Schaeffler, Raymund ;
Werner, Juergen H. ;
Rau, Uwe .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2010, 94 (06) :979-984
[9]   Series resistance imaging of solar cells by voltage dependent electroluminescence [J].
Hinken, David ;
Ramspeck, Klaus ;
Bothe, Karsten ;
Fischer, Bernhard ;
Brendel, Rolf .
APPLIED PHYSICS LETTERS, 2007, 91 (18)
[10]   Experimental setup for camera-based measurements of electrically and optically stimulated luminescence of silicon solar cells and wafers [J].
Hinken, David ;
Schinke, Carsten ;
Herlufsen, Sandra ;
Schmidt, Arne ;
Bothe, Karsten ;
Brendel, Rolf .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (03)