Genetic analysis for yield and yield attributes in greengram (Vigna radiata L. Wilczek)

被引：4

作者：

Narasimhulu, R. ^{[1
]}

Naidu, N. V. ^{[1
,2
]}

Reddy, K. H. P. ^{[1
]}

机构：

[1] Sri Venkateswara Agr Coll, Dept Genet & Plant Breeding, Tirupati 517502, Andhra Pradesh, India

[2] ANGRAU, Res, Guntur 522509, Andhra Pradesh, India

来源：

LEGUME RESEARCH | 2018年 / 41卷 / 03期

关键词：

Bi-parental mating; Gene effects; Generation mean analysis; Greengram; Tolerance to MYMV;

D O I：

10.18805/LR-3768

中图分类号：

S3 [农学（农艺学）];

学科分类号：

0901 ;

摘要：

Six basic generations viz., P-1, P-2, F-1, F-2, B-1 and B-2 of five selected crosses viz., LGG-460 x WGG-37, TM-96-2 x WGG-37, TM-96-2 x PM-112, MGG-295 x PM-110 and MGG-351 x PM-115 were studied to assess the nature and mode of gene action for yield and its component traits through generation mean analysis. In general, magnitude of dominance effects (h) has greater value than additive effects (d) for majority of the traits in all the crosses. All the traits are under the influence of duplicate epistasis besides additive type of gene effects for which bi-parental mating or inter-se mating may be adopted followed by pedigree method of selection to modify the genetic architecture of greengram for attaining higher yields with desirable properties.

引用

页码：349 / 355

页数：7