Insights into the nature of optically active defects of ZnO

被引:17
作者
Cabral, L. [1 ]
Lopez-Richard, Victor [2 ]
Da Silva, Juarez L. F. [3 ]
Marques, G. E. [2 ]
Lima, Matheus P. [2 ]
Onofre, Y. J. [2 ]
Teodoro, M. D. [2 ]
de Godoy, M. P. F. [2 ]
机构
[1] Univ Estadual Campinas, Inst Phys Gleb Wataghin IFGW, BR-13083859 Campinas, SP, Brazil
[2] Univ Fed Sao Carlos, Dept Phys, BR-13565905 Sao Carlos, SP, Brazil
[3] Univ Sao Paulo, Sao Carlos Inst Chem, BR-13560970 Sao Carlos, SP, Brazil
基金
巴西圣保罗研究基金会; 瑞典研究理事会;
关键词
Zinc-oxide; Photoluminescence; Photoconductivity; DFT; ZINC-OXIDE; THIN-FILMS; LUMINESCENCE; PHOTOLUMINESCENCE; ULTRAVIOLET; DEPENDENCE; EMISSION; DYNAMICS;
D O I
10.1016/j.jlumin.2020.117536
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
ZnO is a wide bandgap semiconductor in which point and extended defects tune its optoelectronic properties, and the identification of essential microscopic ingredients for such a tunning is a challenging task. In this work, we combine experimental techniques with theoretical calculations at the atomistic level to investigate a variety of neutral and charged point defects along with their response to thermal treatment by optical and transport measurements. We obtain photoluminescence spectra compatible with simulations of Zn vacancies, oxygen interstitials, and complexes combining vacancies of Zn and O. Annealing is an effective way to neutralize the oxygen interstitials, being an effective mechanism to control the ZnO optoelectronic properties. The photosensitive behavior is explored in temperature-dependent electrical responses under different cooling-down modes. The role of both, extended and point defects, in the photoexcitation with energies below and above the bandgap is also discussed.
引用
收藏
页数:10
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