Growth process of hexagonal boron nitride in the diffusion and precipitation method studied by X-ray photoelectron spectroscopy

被引:0
|
作者
Suzuki, Satoru [1 ]
Haruyama, Yuichi [1 ]
机构
[1] Univ Hyogo, Lab Adv Sci & Technol Ind, Koto Ku, Ako, Hyogo 6781205, Japan
关键词
CHEMICAL-VAPOR-DEPOSITION; LIQUID NICKEL; GRAPHENE; NITROGEN; SOLUBILITY; BN;
D O I
10.7567/1347-4065/ab203a
中图分类号
O59 [应用物理学];
学科分类号
摘要
Submonolayer h-BN was grown on Ni foil in ultra-high vacuum by the diffusion and precipitation method and the growth process was studied by X-ray photoelectron spectroscopy. Formation of h-BN started to be observed at 600 degrees C. All through the process, the surface was always slightly B-rich, which is consistent with the fact that B which is soluble in Ni at a high temperature can diffuse in Ni by the conventional bulk diffusion and insoluble N cannot. Moreover, both formation and decomposition of h-BN were found to occur at elevated temperatures possibly depending on provision of N atoms to the surface. On the Ni surface, decomposition of h-BN was observed at a relatively low temperature of 800 degrees C. (C) 2019 The Japan Society of Applied Physics
引用
收藏
页数:4
相关论文
共 50 条
  • [21] A theoretical interpretation of near edge X-ray absorption fine structure of hexagonal boron nitride monolayer on Ni(111)
    Shimoyama, I.
    Baba, Y.
    Sekiguchi, T.
    Nath, K. G.
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2009, 175 (1-3) : 6 - 13
  • [22] Ultrafast x-ray photoelectron spectroscopy in the microsecond time domain
    Hoefert, O.
    Gleichweit, C.
    Steinrueck, H. -P.
    Papp, C.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (09):
  • [23] Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy
    Blanton, Thomas N.
    Majumdar, Debasis
    POWDER DIFFRACTION, 2013, 28 (02) : 68 - 71
  • [24] X-ray photoelectron spectroscopy characterization of amorphous and nanosized thin carbon films
    Avramova, I.
    Dikovska, A.
    Valcheva, E.
    Terziiska, P.
    Mladenoff, J.
    Tzonev, L.
    Kolev, S.
    Milenov, T.
    20TH INTERNATIONAL CONFERENCE AND SCHOOL ON QUANTUM ELECTRONICS: LASER PHYSICS AND APPLICATIONS, 2019, 11047
  • [25] An X-ray photoelectron spectroscopy study of ultra-thin oxynitride films
    Ladas, S.
    Sygellou, L.
    Kennou, S.
    Wolf, M.
    Roeder, G.
    Nutsch, A.
    Rambach, M.
    Lerch, W.
    THIN SOLID FILMS, 2011, 520 (02) : 871 - 875
  • [26] Early stages of surface graphitization on nanodiamond probed by x-ray photoelectron spectroscopy
    Petit, Tristan
    Arnault, Jean-Charles
    Girard, Hugues A.
    Sennour, Mohamed
    Bergonzo, Philippe
    PHYSICAL REVIEW B, 2011, 84 (23)
  • [27] Surface Chemistry Analysis of Carbon Nanotube Fibers by X-Ray Photoelectron Spectroscopy
    Aleman, Belen
    Vila, Maria
    Vilatela, Juan J.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2018, 215 (19):
  • [28] Determination of InN/Diamond Heterojunction Band Offset by X-ray Photoelectron Spectroscopy
    Shi, K.
    Li, D. B.
    Song, H. P.
    Guo, Y.
    Wang, J.
    Xu, X. Q.
    Liu, J. M.
    Yang, A. L.
    Wei, H. Y.
    Zhang, B.
    Yang, S. Y.
    Liu, X. L.
    Zhu, Q. S.
    Wang, Z. G.
    NANOSCALE RESEARCH LETTERS, 2011, 6 : 1 - 5
  • [29] X-ray photoelectron spectroscopy analysis of TlInGaAsN semiconductor system and their annealing-induced structural changes
    Kim, Kang Min
    Kim, Woo-Byoung
    Krishnamurthy, Daivasigamani
    Ishimaru, Manabu
    Kobayashi, Hikaru
    Hasegawa, Shigehiko
    Asahi, Hajime
    JOURNAL OF APPLIED PHYSICS, 2010, 108 (12)
  • [30] Direct observation of N-(group V) bonding defects in dilute nitride semiconductors using hard x-ray photoelectron spectroscopy
    Ishikawa, F.
    Fuyuno, S.
    Higashi, K.
    Kondow, M.
    Machida, M.
    Oji, H.
    Son, J. -Y.
    Trampert, A.
    Umeno, K.
    Furukawa, Y.
    Wakahara, A.
    APPLIED PHYSICS LETTERS, 2011, 98 (12)