Testability implications in low-cost integrated radio transceivers: A Bluetooth case study

被引：17

作者：

Ozev, S ^{[1
]}

Olgaard, C ^{[1
]}

Orailoglu, A ^{[1
]}

机构：

[1] Univ Calif San Diego, CSE Dept, La Jolla, CA 92093 USA

来源：

INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS | 2001年

关键词：

D O I：

10.1109/TEST.2001.966721

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

As the use of wireless communications in daily life increases, attaining low-cost solutions becomes increasingly important due to shrinking profit margins. Cost optimization that solely targets at minimization of the cost of system architecture may result in suboptimal, highly untestable, solutions. Test design and design for testability need to be incorporated into the system design flow to achieve viable solutions. This paper presents an analysis of test requirements, implications and test cost for low-cost Bluetooth systems. Testability problems are identified and possible solutions along with avenues to reduce the test cost by utilizing lower-cost testers are discussed.

引用

页码：965 / 974

页数：10

共 6 条

[1]

FAGUE DE, 1994, VTC 1994 - 1994 IEEE 44TH VEHICULAR TECHNOLOGY CONFERENCE, VOLS 1-3, P512, DOI 10.1109/VETEC.1994.345073

[2] An architecture for self-test of a wireless communication system using sampled IQ modulation and boundary scan [J].