Heavily phosphorus-doped silicon nanoparticles as intermediate layer in solar cell based on IFO/p-Si heterojunction

被引:8
作者
Chebotareva, A. B. [1 ]
Untila, G. G. [1 ]
Kost, T. N. [1 ]
机构
[1] Moscow MV Lomonosov State Univ, Skobeltsyn Inst Nucl Phys, Moscow 119234, Russia
基金
俄罗斯基础研究基金会;
关键词
Silicon nanoparticles; Silicon solar cell; Heterojunction; Transparent conducting oxide; INDIUM OXIDE-FILMS; ULTRASONIC SPRAY-PYROLYSIS; ZNO FILMS; NANOCRYSTALS; DEPOSITION; JUNCTION; SURFACE; AL; PASSIVATION; EFFICIENCY;
D O I
10.1016/j.solener.2015.09.038
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
The goal of this work is to investigate the effect of heavily phosphorus-doped silicon nanoparticles (NP-n(+))Si introduced between the p-type silicon substrate and indium fluorine oxide (IFO) thin film on the performance of the IFO/(NP-n(+)ipp(+))Cz-Si (Czochralski silicon)/indium tin oxide (ITO) heterojunction solar cell. Nanoparticles were deposited on p-Si surface from ethanol-based colloidal suspension by ultrasonic spray coating. The IFO and ITO films were grown by ultrasonic spray pyrolysis. A reference solar cell without nanoparticles with IFO/(pp(+))Cz-Si/ITO structure was also fabricated and studied. SEM, EDX, XPS, and FTIR spectroscopy, reflection and external quantum efficiency spectra, Suns-V-oc measurements were used for the analysis. It was shown that the phosphorus doping level of (NP-n(+)) Si is of about 3 x 10(20) cm(-3). After deposition, NPs are covered with SiOx layer which is removed by HF dip. The mean NPs size is of about 5.7 nm. An increase in duration of NPs deposition from 7 to 19 min leads to an increase in density of NPs from 5.6 x 10(11) to 1.06 x 10(12) cm(-2) and, consequently, to an increase in NPs surface coverage from 10.6% to 27.5%. IFO/(NP-n(+)/pp(+))Cz-Si solar cell with NPs surface coverage of 27.5% have shown noticeably higher power conversion efficiency of 13.2% in comparison with 11.9% efficiency obtained for the reference cell. This result is achieved due to increased open-circuit voltage (571 mV in the NPs-based solar cell against 484 mV for the reference cell). (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码:650 / 657
页数:8
相关论文
共 49 条
[1]   Semiconductor solar cells: Recent progress in terrestrial applications [J].
Avrutin, V. ;
Izyumskaya, N. ;
Morkoc, H. .
SUPERLATTICES AND MICROSTRUCTURES, 2011, 49 (04) :337-364
[2]   Hole Selective MoOx Contact for Silicon Solar Cells [J].
Battaglia, Corsin ;
Yin, Xingtian ;
Zheng, Maxwell ;
Sharp, Ian D. ;
Chen, Teresa ;
McDonnell, Stephen ;
Azcatl, Angelica ;
Carraro, Carlo ;
Ma, Biwu ;
Maboudian, Roya ;
Wallace, Robert M. ;
Javey, Ali .
NANO LETTERS, 2014, 14 (02) :967-971
[3]   ALD grown bilayer junction of ZnO:Al and tunnel oxide barrier for SIS solar cell [J].
Bethge, O. ;
Nobile, M. ;
Abermann, S. ;
Glaser, M. ;
Bertagnolli, E. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2013, 117 :178-182
[4]   ANOMALOUS OPTICAL ABSORPTION LIMIT IN INSB [J].
BURSTEIN, E .
PHYSICAL REVIEW, 1954, 93 (03) :632-633
[5]   ITO deposited by pyrosol for photovoltaic applications [J].
Chebotareva, A. B. ;
Untila, G. G. ;
Kost, T. N. ;
Jorgensen, S. ;
Ulyashin, A. G. .
THIN SOLID FILMS, 2007, 515 (24) :8505-8510
[6]   Effects of TCO work function on the performance of TCO/n-Si hetero-junction solar cells [J].
Chen, Aqing ;
Zhu, Kaigui .
SOLAR ENERGY, 2014, 107 :195-201
[7]   Effects of indium concentration on the properties of In-doped ZnO films: Applications to silicon wafer solar cells [J].
Djessas, K. ;
Bouchama, I. ;
Gauffier, J. L. ;
Ben Ayadi, Z. .
THIN SOLID FILMS, 2014, 555 :28-32
[8]   On the application of thin films of silicon nanoparticles for increasing solar cell efficiency [J].
Dorofeev, S. G. ;
Kononov, N. N. ;
Zverolovlev, V. M. ;
Zinoviev, K. V. ;
Sukhanov, V. N. ;
Sukhanov, N. M. ;
Gribov, B. G. .
SEMICONDUCTORS, 2014, 48 (03) :360-368
[9]   Effects of indium concentration on the efficiency of amorphous In-Zn-O/SiOx/n-Si hetero-junction solar cells [J].
Fang, Hau-Wei ;
Hsieh, Tsung-Eong ;
Juang, Jenh-Yih .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2014, 121 :176-181
[10]  
Feng T., 1982, P 16 IEEE PHOT SPEC, P961