High-precision parallel-beam X-ray system for high-temperature diffraction studies

A recently developed Rigaku parallel-beam X-ray diffraction system equipped with a parabolic graded-multilayer mirror in the incident beam and a parallel-slits analyzer in the diffracted beam was used for precision high-temperature diffraction studies. The lattice parameters a and c of alpha-Al2O3 at room temperature and up to 1473 K were determined with precision in the range of 0.6- 7.3 X 10(-5). The thermal expansion coefficients for a and c agreed with literature values to better than 3%. The system was used successfully also to determine the Debye characteristic temperature of Si and to study structural phase transition of LaCoO3 from rhombohedral at room temperature to cubic at 1700 K. (C) 2002 International Centre for Diffraction Data.