Application of magnetic force microscopy in nanomaterials characterization

被引：13
作者：
De Lozanne, Alex
机构：
[1] Univ Texas, Dept Phys, Ctr Nano & Mol Sci & Technol, Austin, TX 78712 USA
[2] Univ Texas, Texas Mat Inst, Austin, TX 78712 USA
来源：
MICROSCOPY RESEARCH AND TECHNIQUE | 2006年 / 69卷 / 07期
关键词：
magnetic materials; nanostructures; magnetic force microscopy; scanning probe microscopy;
D O I：
10.1002/jemt.20325
中图分类号：
R602 [外科病理学、解剖学]; R32 [人体形态学];
学科分类号：
100101 ;
摘要：
This review describes the basic technical aspects of magnetic force microscopy and how this technique has been applied to the study of colossal magnetoresistance materials, superconductors, and patterned magnetic materials. Recently, current distribution in a patterned aluminum strip has been measured by magnetic force microscopy, opening the possibility of measuring currents in buried interconnects in integrated circuits.
引用
收藏
页码：550 / 562
页数：13
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