Generalized ellipsometry for orthorhombic, absorbing materials:: dielectric functions, phonon modes and band-to-band transitions of Sb2S3

被引：32

作者：

Schubert, M

Hofmann, T

Herzinger, CM

Dollase, W

机构：

[1] Univ Leipzig, Inst Expt Phys 2, D-04103 Leipzig, Germany

[2] JA Woollam Co Inc, Lincoln, NE 68508 USA

[3] Univ Calif Los Angeles, Dept Earth & Space Sci, Los Angeles, CA 90095 USA

来源：

THIN SOLID FILMS | 2004年 / 455卷

关键词：

dielectric functions; band-to-band transitions; phonon modes; anisotropy; generalized ellipsometry; stibnite;

D O I：

10.1016/j.tsf.2003.11.207

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Generalized ellipsometry allows complete extraction of the dielectric function tensor, including orientation, from measurement of skew-cut single crystal orthorhombic absorbing materials. As an example, Stibnite (Sb2S3) is studied to determine fundamental phonon modes and band-to-band transitions, which are here provided for polarization along axes a, b, and c from lineshape analysis of the major dielectric function spectra. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：619 / 623

页数：5

共 14 条

[1] GENERALIZED ELLIPSOMETRY FOR SURFACES WITH DIRECTIONAL PREFERENCE - APPLICATION TO DIFFRACTION GRATINGS [J].