Ferroelectric studies for soft Gd-modified PZT ceramics

被引:9
作者
Panigrahi, S. C. [1 ,3 ]
Das, Piyush R. [2 ]
Choudhary, R. N. P. [1 ]
机构
[1] Siksha O Anusandhan Univ, Inst Tech Educ & Res, Dept Phys, Bhubaneswar, Odisha, India
[2] VSSUT, Dept Phys, Burla, Sambalpur, India
[3] Tihidi Coll, Dept Phys, Bhadrak, India
关键词
X-ray diffraction; SEM; non-relaxor; ferroelectricity; piezoelectric coefficients; FREQUENCY-TEMPERATURE RESPONSE; ELECTRICAL-PROPERTIES; DIFFERENT PRECURSORS; A-SITE; SUBSTITUTION; ACTUATOR; SENSOR; DY;
D O I
10.1080/01411594.2018.1481213
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The polycrystalline samples of gadolinium-modified lead-zirconate-titanate (Pb1-xGdx (Zr0.52Ti0.48)(1-x/4)O-3) (x=0, 0.07, 0.10 and 0.12) (PGZT x/52/48) ceramics near morphotropic-phase boundary were prepared using conventional solid-state reaction route. XRD patterns show the formation of single-phase compounds in rhombohedral crystal system. SEM textures of the samples reveal uniform grain distribution. Frequency and temperature dependence of dielectric constant of the materials indicates non-relaxor behavior and indication of the diffuse phase transition at higher values of Gd concentration. The temperature dependence of P-E loops confirms ferroelectricity in the materials. The piezoelectric studies of the samples show enhancement in piezoelectric coefficients on substitution of Gd at the Pb site.
引用
收藏
页码:703 / 714
页数:12
相关论文
共 41 条
  • [1] Ambika D., 2012, Adv. Mater. Lett., V3, P102, DOI [10.5185/amlett.2011.7281, DOI 10.5185/AMLETT.2011.7281]
  • [2] [Anonymous], POWD INTERACTIVE POW
  • [3] Design and calibration of a piezoelectric actuator for interferometric applications
    Bruno, Luigi
    Poggialini, Andrea
    Felice, Giuseppina
    [J]. OPTICS AND LASERS IN ENGINEERING, 2007, 45 (12) : 1148 - 1156
  • [4] Structural origin of relaxor perovskites
    Chen, IW
    Li, P
    Wang, Y
    [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1996, 57 (10) : 1525 - 1536
  • [5] Structural and electrical properties of Na2Pb2Eu2W2Ti4X4O30 (X = Nb, Ta) ferroelectric ceramics
    Das, Piyush R.
    Biswal, L.
    Behera, Banarji
    Choudhary, R. N. P.
    [J]. MATERIALS RESEARCH BULLETIN, 2009, 44 (06) : 1214 - 1218
  • [6] Fabrication and characterization of microcantilever integrated with PZT thin film sensor and actuator
    Dong, Weijie
    Lu, Xiaoguang
    Cui, Yan
    Wang, Jing
    Liu, Mengwei
    [J]. THIN SOLID FILMS, 2007, 515 (24) : 8544 - 8548
  • [7] Evidence of temperature dependent domain wall dynamics in hard lead zirconate titanate piezoceramics
    Garcia, J. E.
    Ochoa, D. A.
    Gomis, V.
    Eiras, J. A.
    Perez, R.
    [J]. JOURNAL OF APPLIED PHYSICS, 2012, 112 (01)
  • [8] Growth and characterization of epitaxial ferroelectric PbZrxTi1-xO3 thin film capacitors with SrRuO3 electrodes for non-volatile memory applications
    Guerrero, C
    Roldán, J
    Ferrater, C
    Garcia-Cuenca, MV
    Sánchez, F
    Varela, M
    [J]. SOLID-STATE ELECTRONICS, 2001, 45 (08) : 1433 - 1440
  • [9] Ferroelectric ceramics: History and technology
    Haertling, GH
    [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1999, 82 (04) : 797 - 818
  • [10] DISTRIBUTION OF A-SITE AND B-SITE VACANCIES IN (PB,LA) (TI,ZR)O3 CERAMICS
    HARDTL, KH
    HENNINGS, D
    [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1972, 55 (05) : 230 - &