Monovacancy and substitutional defects in hexagonal silicon nanotubes

被引:7
作者
Kim, Gunn [1 ,2 ]
Hong, Suklyun [3 ,4 ]
机构
[1] Sungkyunkwan Univ, Phys Res Div BK21, Suwon 440746, South Korea
[2] Sungkyunkwan Univ, Dept Phys, Suwon 440746, South Korea
[3] Sejong Univ, Dept Phys, Seoul 143747, South Korea
[4] Sejong Univ, Inst Fundamental Phys, Seoul 143747, South Korea
关键词
Silicon nanotube; Monovacancy; Substitutional defects; Electronic structure; PSEUDOPOTENTIALS;
D O I
10.1016/j.ssc.2008.12.010
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We present a first-principles study of the geometrical and electronic structures of a hexagonal single-walled silicon nanotube with a monovacancy or a substitutional defect. The B, C, N, At and P atoms are chosen as substitutional impurities. It is found that the defect such as a monovacancy or a substitutional impurity results in deformation of the hexagonal single-walled silicon nanotube. In both cases, a relatively localized unoccupied state near the Fermi level occurs due to this local deformation. The differences in geometrical and electronic properties of different substitutional impurities are discussed. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码:408 / 411
页数:4
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